Monte Carlo simulations of secondary electron emission from CsI, induced by 1–10 keV x rays and electrons

1992 ◽  
Vol 72 (11) ◽  
pp. 5429-5436 ◽  
Author(s):  
A. Akkerman ◽  
A. Gibrekhterman ◽  
A. Breskin ◽  
R. Chechik
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
X Rays

scholarly journals Secondary electron emission under magnetic constraint: from Monte Carlo simulations to analytical solution

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Claudiu Costin
Keyword(s):  
Magnetic Field ◽  
Monte Carlo ◽  
Analytical Solution ◽  
Monte Carlo Simulations ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Emission Process ◽  
Wide Range ◽  
The Magnetic Field

AbstractThe secondary electron emission process is essential for the optimal operation of a wide range of applications, including fusion reactors, high-energy accelerators, or spacecraft. The process can be influenced and controlled by the use of a magnetic field. An analytical solution is proposed to describe the secondary electron emission process in an oblique magnetic field. It was derived from Monte Carlo simulations. The analytical formula captures the influence of the magnetic field magnitude and tilt, electron emission energy, electron reflection on the surface, and electric field intensity on the secondary emission process. The last two parameters increase the effective emission while the others act the opposite. The electric field effect is equivalent to a reduction of the magnetic field tilt. A very good agreement is shown between the analytical and numerical results for a wide range of parameters. The analytical solution is a convenient tool for the theoretical study and design of magnetically assisted applications, providing realistic input for subsequent simulations.

scholarly journals Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments

2018 ◽  
Vol 31 (5) ◽  
pp. 055901 ◽  
Author(s):  
Martina Azzolini ◽  
Marco Angelucci ◽  
Roberto Cimino ◽  
Rosanna Larciprete ◽  
Nicola M Pugno ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission

scholarly journals Monte Carlo raytracing method for calculating secondary electron emission from micro-architected surfaces

2019 ◽  
Vol 478 ◽  
pp. 142-149 ◽  
Author(s):  
Andrew Alvarado ◽  
Hsing-Yin Chang ◽  
Warren Nadvornick ◽  
Nasr Ghoniem ◽  
Jaime Marian
Keyword(s):  
Monte Carlo ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission
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