scholarly journals Thermal exchange bias field drift in field cooled Mn83Ir17/Co70Fe30 thin films after 10 keV He ion bombardment

2011 ◽  
Vol 109 (2) ◽  
pp. 023910 ◽  
Author(s):  
Arno Ehresmann ◽  
Christoph Schmidt ◽  
Tanja Weis ◽  
Dieter Engel
SPIN ◽  
2019 ◽  
Vol 09 (01) ◽  
pp. 1950004
Author(s):  
Jingchun Wang ◽  
Floriano Cuccureddu ◽  
Rafael Ramos ◽  
Cormac Ó. Coileáin ◽  
Igor V. Shvets ◽  
...  

We present the possibility of enhancing magnetoresistance (MR) by controlling nanoscale domain wall (DW) width in a planar nanowire array. Results based on micromagnetic calculations show that DW width decreases with increasing exchange bias field and decreases with reducing exchange interaction between neighboring nanowires. Fe/Fe3O4 nanowire arrays were grown on [Formula: see text]-plane sapphire to demonstrate the feasibility of this concept, and an enhanced MR ratio of 3.7% was observed at room temperature. compared with flat and stepped Fe3O4 thin films.


2000 ◽  
Vol 77 (23) ◽  
pp. 3815-3817 ◽  
Author(s):  
M. Fraune ◽  
U. Rüdiger ◽  
G. Güntherodt ◽  
S. Cardoso ◽  
P. Freitas

2014 ◽  
Vol 875-877 ◽  
pp. 272-276 ◽  
Author(s):  
Chao Jing ◽  
Ye Jun Yang ◽  
Dong Hua Yu ◽  
Zhe Li ◽  
Xiao Long Wang ◽  
...  

We report the exchange bias properties in the bulk Ni45Co5Mn38Sn12quaternary Heusler alloy. The ferromagnetic (FM) –antiferromagnetic (AFM) interactions get reinforced after the Co substitution for Ni in the Ni-Mn-Sn alloy, which increase the exchange bias field (HE). A maximum shift in hysteresis loops of 306 Oe was observed in the 10 kOe field cooled sample. The origin of this large exchange bias field has been discussed. Magnetic hysteresis loop obtained in the zero field cooled (ZFC) mode shows double-shifted loop, and the reason of this phenomenon has been explained in detail.


2006 ◽  
Vol 99 (8) ◽  
pp. 08C108 ◽  
Author(s):  
V. P. Nascimento ◽  
E. Baggio Saitovitch ◽  
F. Pelegrini ◽  
L. C. Figueiredo ◽  
A. Biondo ◽  
...  

2013 ◽  
Vol 114 (7) ◽  
pp. 073908 ◽  
Author(s):  
Ki-Yeon Kim ◽  
Hyeok-Cheol Choi ◽  
Sin-Yong Jo ◽  
Chun-Yeol You

1998 ◽  
Vol 34 (4) ◽  
pp. 867-869 ◽  
Author(s):  
G. Choe ◽  
A. Tsoukatos ◽  
S. Gupta

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