X‐ray photoelectron spectroscopy analysis of polyimide films modified by ultraviolet pulsed laser radiation at 193 nm

1994 ◽  
Vol 75 (4) ◽  
pp. 2015-2019 ◽  
Author(s):  
A. Brezini ◽  
N. Zekri
2018 ◽  
Vol 101 (8) ◽  
pp. 3347-3356 ◽  
Author(s):  
Emeline Baudet ◽  
Christophe Cardinaud ◽  
Rémi Boidin ◽  
Aurélie Girard ◽  
Jan Gutwirth ◽  
...  

1990 ◽  
Vol 201 ◽  
Author(s):  
P. J. John ◽  
V. J. Dyhouse ◽  
N. T. McDevitt ◽  
A. Safriet ◽  
J. S. Zabinski ◽  
...  

AbstractFilms of MoS2 have been successfully deposited on 440C stainless steel using an excimer laser. A comparison was made of films ablated with the laser operating at 193 nm and at 248 nm. The effects of substrate temperature were also studied. X-ray Photoelectron Spectroscopy (XPS) measurements indicated that the films were sulphur rich as compared to single crystal MoS2. Laser Raman measurements indicated that annealing was necessary to obtain crystalline films. All films exhibited coefficients of friction in the neighborhood of 0.03 in a dry nitrogen environment. Coefficients of friction in laboratory air were significantly higher.


1994 ◽  
Vol 33 (3) ◽  
pp. 331-338 ◽  
Author(s):  
Paul P. van Saarloos ◽  
Chris F. Vernon ◽  
Traian V. Chirila ◽  
Craig Klauber

2006 ◽  
Vol 51 (4) ◽  
pp. 514-518 ◽  
Author(s):  
V. O. Stoyanovsky ◽  
V. N. Snytnikov ◽  
N. A. Rudina ◽  
V. N. Parmon

Author(s):  
Yu. P. Pershyn ◽  
D. L. Voronov ◽  
E. N. Zubarev ◽  
V. A. Sevryukova ◽  
V. V.Kondratenko ◽  
...  

2014 ◽  
Vol 59 (12) ◽  
pp. 1149-1154
Author(s):  
A.D. Mamuta ◽  
◽  
V.S. Voitsekhovich ◽  
N.M. Kachalova ◽  
L.F. Golovko ◽  
...  

2011 ◽  
Vol 22 (29) ◽  
pp. 295304 ◽  
Author(s):  
A Pérez del Pino ◽  
E György ◽  
I C Marcus ◽  
J Roqueta ◽  
M I Alonso

2005 ◽  
Vol 12 (02) ◽  
pp. 185-195
Author(s):  
M. RUSOP ◽  
T. SOGA ◽  
T. JIMBO

Amorphous carbon nitride films ( a-CN x) were deposited by pulsed laser deposition of camphoric carbon target with different substrate temperatures (ST). The influence of ST on the synthesis of a-CN x films was investigated. The nitrogen-to-carbon (N/C) and oxygen-to-carbon (O/C) atomic ratios, bonding state, and microstructure of the deposited a-CN x films were characterized by X-ray photoelectron spectroscopy and were confirmed by other standard measurement techniques. The bonding states between C and N , and C and O in the deposited films were found to be significantly influenced by ST during the deposition process. The N/C and O/C atomic ratios of the a-CN x films reached the maximum value at 400°C. ST of 400°C was proposed to promote the desired sp 3-hybridized C and the C 3 N 4 phase. The C–N bonding of C–N , C=N and C≡N were observed in the films.


Sign in / Sign up

Export Citation Format

Share Document