Structural Properties Studies of Zinc Oxide Thin Film Grown on Silicon Carbide by Means of X-ray Diffraction Technique

2011 ◽  
Author(s):  
C. G. Ching ◽  
S. S. Ng ◽  
Z. Hassan ◽  
H. Abu Hassan ◽  
N. H. Al-Hardan ◽  
...  
2011 ◽  
Vol 11 (14) ◽  
pp. 2546-2553
Author(s):  
Amir Sayid Hassan Roz ◽  
Ghahraman Solookinej ◽  
Mohammad Hossein Habibi

2013 ◽  
Vol 52 (3S) ◽  
pp. 03BB03 ◽  
Author(s):  
Shinnosuke Iwamatsu ◽  
Kazushige Takechi ◽  
Toru Yahagi ◽  
Yoshiyuki Watanabe ◽  
Hiroshi Tanabe ◽  
...  

2015 ◽  
Vol 135 (6) ◽  
pp. 192-198 ◽  
Author(s):  
Shinnosuke Iwamatsu ◽  
Yutaka Abe ◽  
Toru Yahagi ◽  
Seiya Kobayashi ◽  
Kazushige Takechi ◽  
...  

2018 ◽  
Vol 28 (4) ◽  
pp. 247-253
Author(s):  
Dae-Gyu Yang ◽  
Hyoung-Do Kim ◽  
Jong-Heon Kim ◽  
Hyun-Suk Kim

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