X-ray study of thermal expansion behaviors and Grüneisen parameters of cadmium germanium arsenide crystal over the temperature range 25–450 °C

2013 ◽  
Vol 114 (5) ◽  
pp. 053513 ◽  
Author(s):  
W. Liu ◽  
B. Zhao ◽  
S. Zhu ◽  
Z. He ◽  
B. Chen ◽  
...  
2010 ◽  
Vol 663-665 ◽  
pp. 1008-1011
Author(s):  
Ling Hang Wang

The thermal expansion of a novel semiconductor material, mercury indium telluride (MIT) grown by vertical Bridgman (VB) method, was measured from room temperature till 573K by two methods, i.e. Macroscopic dilatometric and X-ray measurements. It is found that the macroscopic expansion is quite different from the expansion of the lattice (micro-expansion). The macroscopic expansion is lower than micro-expansion in the temperature range of 303-425.5K and has a minimum of -0.14% linear expansion, while the macro-expansion becomes larger than micro-expansion in the temperature higher than 425.5K. The former may be due to the effects of the existing neutral vacancies. The latter may result from the influence of thermal-activated vacancies on the lattice.


1998 ◽  
Vol 12 (04) ◽  
pp. 449-470 ◽  
Author(s):  
Goutam Dev Mukherjee ◽  
C. Bansal ◽  
Ashok Chatterjee

Thermal expansion measurements have been performed on nickel and iron using a three terminal capacitance dilatometer with a new cell design and a theoretical model has been developed to obtain the electron-magnetic, lattice and magnon contributions to thermal expansion and corresponding Grüneisen parameters.


1997 ◽  
Vol 55 (17) ◽  
pp. 11293-11299 ◽  
Author(s):  
D. N. Talwar ◽  
G. Thaler ◽  
S. Zaranek ◽  
K. Peterson ◽  
S. Linger ◽  
...  

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