Study of deep hole trap levels associated with bias-induced metastabilities in Cu(In,Ga)Se2thin films using isothermal capacitance transient spectroscopy

2014 ◽  
Vol 115 (5) ◽  
pp. 054507 ◽  
Author(s):  
Hiroshi Okada ◽  
Takashi Minemoto
1990 ◽  
Vol 67 (3) ◽  
pp. 1380-1383 ◽  
Author(s):  
Eun Kyu Kim ◽  
Hoon Young Cho ◽  
Suk‐Ki Min ◽  
Sung Ho Choh ◽  
Susumu Namba

1989 ◽  
Vol 28 (Part 2, No. 4) ◽  
pp. L714-L716 ◽  
Author(s):  
Takao Maeda ◽  
Sakae Meguro ◽  
Masasuke Takata

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