Study of deep hole trap levels associated with bias-induced metastabilities in Cu(In,Ga)Se2thin films using isothermal capacitance transient spectroscopy
2002 ◽
Vol 210-212
◽
pp. 1-14
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2017 ◽
pp. 355-358
1989 ◽
Vol 28
(Part 2, No. 4)
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pp. L714-L716
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1991 ◽
Vol 74
(10)
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pp. 2675-2678
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