scholarly journals Correlation of interface states/border traps and threshold voltage shift on AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors

2015 ◽  
Vol 107 (9) ◽  
pp. 093507 ◽  
Author(s):  
Tian-Li Wu ◽  
Denis Marcon ◽  
Benoit Bakeroot ◽  
Brice De Jaeger ◽  
H. C. Lin ◽  
...  
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