InAlN high electron mobility transistor Ti/Al/Ni/Au Ohmic contact optimisation assisted by in-situ high temperature transmission electron microscopy

2015 ◽  
Vol 107 (11) ◽  
pp. 113506 ◽  
Author(s):  
M. D. Smith ◽  
D. O'Mahony ◽  
M. Conroy ◽  
M. Schmidt ◽  
P. J. Parbrook
1998 ◽  
Vol 4 (3) ◽  
pp. 269-277 ◽  
Author(s):  
A. Agrawal ◽  
J. Cizeron ◽  
V.L. Colvin

In this work, the high-temperature behavior of nanocrystalline TiO2 is studied using in situ transmission electron microscopy (TEM). These nanoparticles are made using wet chemical techniques that generate the anatase phase of TiO2 with average grain sizes of 6 nm. X-ray diffraction studies of nanophase TiO2 indicate the material undergoes a solid-solid phase transformation to the stable rutile phase between 600° and 900°C. This phase transition is not observed in the TEM samples, which remain anatase up to temperatures as high as 1000°C. Above 1000°C, nanoparticles become mobile on the amorphous carbon grid and by 1300°C, all anatase diffraction is lost and larger (50 nm) single crystals of a new phase are present. This new phase is identified as TiC both from high-resolution electron microscopy after heat treatment and electron diffraction collected during in situ heating experiments. Video images of the particle motion in situ show the nanoparticles diffusing and interacting with the underlying grid material as the reaction from TiO2 to TiC proceeds.


1990 ◽  
Vol 183 ◽  
Author(s):  
J. L. Batstone

AbstractMotion of ordered twin/matrix interfaces in films of silicon on sapphire occurs during high temperature annealing. This process is shown to be thermally activated and is analogous to grain boundary motion. Motion of amorphous/crystalline interfaces occurs during recrystallization of CoSi2 and NiSi2 from the amorphous phase. In-situ transmission electron microscopy has revealed details of the growth kinetics and interfacial roughness.


2019 ◽  
Vol 25 (S2) ◽  
pp. 1540-1541
Author(s):  
Daan Hein Alsem ◽  
James Horwath ◽  
Julio Rodriguez-Manzo ◽  
Khim Karki ◽  
Eric Stach

2018 ◽  
Vol 148 ◽  
pp. 1-4 ◽  
Author(s):  
Gowtham Sriram Jawaharram ◽  
Patrick M. Price ◽  
Christopher M. Barr ◽  
Khalid Hattar ◽  
Robert S. Averback ◽  
...  

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