Piezo-electric fields and state-filling photo-luminescence in natural InP/GaInP2 Wigner molecule structures

2021 ◽  
Vol 118 (12) ◽  
pp. 121101
Author(s):  
A. M. Mintairov ◽  
A. V. Ankundinov ◽  
N. A. Kalyuzhnyy ◽  
D. V. Lebedev ◽  
S. A. Mintairov ◽  
...  
1995 ◽  
Vol 09 (09) ◽  
pp. 1025-1044 ◽  
Author(s):  
B. GIL ◽  
P. BIGENWALD ◽  
K.J. MOORE ◽  
P. BORING ◽  
K. WOODBRIDGE

The properties of single and double (Ga,ln)As-GaAs strained-layer quantum wells embedded in (pin) diodes are studied. These properties are found to be orientation-dependent, mainly due to the existence of a strong internal piezoelectric field in the (Ga,ln)As layers when the growth axis is polar. We first calculate how large the influences of the (pin) and piezoelectric field are to produce carrier tunnelling out of the active part of the heterostructure. This enables us to compute the carrier’s lifetime in the heterostructures and the corresponding resonance widths. Next, we compare the binding energies of interacting electron and hole pairs in double quantum wells with or without internal piezo electric fields. We show that the exciton binding energy is less sensitive to the piezoelectric field than the oscillator strength. Under photo excitation, many body-effects and bandgap renormalization can be easily produced in strained-layer quantum wells with internal built-in piezo-electric fields. We illuminated at low temperature single and double Ga 0.92 ln 0.08 As-GaAs strained layer quantum wells grown either along the (001) or (111) direction, and tuned over several decades the densities of photo-injected carriers. The comparison between experimental data and the results of a Hartree calculation including the space charge effects reveals that many body interactions are efficiently photo-induced in the (111)-grown samples. Moreover, we show that the tunnelling of the two lowest-lying heavy-hole levels can be stimulated for moderate carrier densities making such structures promissive in order to realise self electrooptic effect device (SEED) modulators.


Author(s):  
R. R. Dils ◽  
P. S. Follansbee

Electric fields have been applied across oxides growing on a high temperature alloy and control of the oxidation of the material has been demonstrated. At present, three-fold increases in the oxidation rate have been measured in accelerating fields and the oxidation process has been completely stopped in a retarding field.The experiments have been conducted with an iron-base alloy, Pe 25Cr 5A1 0.1Y, although, in principle, any alloy capable of forming an adherent aluminum oxide layer during oxidation can be used. A specimen is polished and oxidized to produce a thin, uniform insulating layer on one surface. Three platinum electrodes are sputtered on the oxide surface and the specimen is reoxidized.


Author(s):  
Teruo Someya ◽  
Jinzo Kobayashi

Recent progress in the electron-mirror microscopy (EMM), e.g., an improvement of its resolving power together with an increase of the magnification makes it useful for investigating the ferroelectric domain physics. English has recently observed the domain texture in the surface layer of BaTiO3. The present authors ) have developed a theory by which one can evaluate small one-dimensional electric fields and/or topographic step heights in the crystal surfaces from their EMM pictures. This theory was applied to a quantitative study of the surface pattern of BaTiO3).


Author(s):  
John Silcox

Several aspects of magnetic and electric effects in electron microscope images are of interest and will be discussed here. Clearly electrons are deflected by magnetic and electric fields and can give rise to image detail. We will review situations in ferromagnetic films in which magnetic image effects are the predominant ones, others in which the magnetic effects give rise to rather subtle changes in diffraction contrast, cases of contrast at specimen edges due to leakage fields in both ferromagnets and superconductors and some effects due to electric fields in insulators.


Author(s):  
J.A. Eades ◽  
A. van Dun

The measurement of magnification in the electron microscope is always troublesome especially when a goniometer stage is in use, since there can be wide variations from calibrated values. One elegant method (L.M.Brown, private communication) of avoiding the difficulties of standard methods would be to fit a device which displaces the specimen a small but known distance and recording the displacement by a double exposure. Such a device would obviate the need for changing the specimen and guarantee that the magnification was measured under precisely the conditions used.Such a small displacement could be produced by any suitable transducer mounted in one of the specimen translation mechanisms. In the present case a piezoelectric crystal was used. Modern synthetic piezo electric ceramics readily give reproducible displacements in the right range for quite modest voltages (for example: Joyce and Wilson, 1969).


Author(s):  
V. Kaushik ◽  
P. Maniar ◽  
J. Olowolafe ◽  
R. Jones ◽  
A. Campbell ◽  
...  

Lead zirconium titanate films (Pb (Zr,Ti) O3 or PZT) are being considered for potential application as dielectric films in memory technology due to their high dielectric constants. PZT is a ferroelectric material which shows spontaneous polarizability, reversible under applied electric fields. We report herein some results of TEM studies on thin film capacitor structures containing PZT films with platinum-titanium electrodes.The wafers had a stacked structure consisting of PZT/Pt/Ti/SiO2/Si substrate as shown in Figure 1. Platinum acts as electrode material and titanium is used to overcome the problem of platinum adhesion to the oxide layer. The PZT (0/20/80) films were deposited using a sol-gel method and the structure was annealed at 650°C and 800°C for 30 min in an oxygen ambient. XTEM imaging was done at 200KV with the electron beam parallel to <110> zone axis of silicon.Figure 2 shows the PZT and Pt layers only, since the structure had a tendency to peel off at the Ti-Pt interface during TEM sample preparation.


Author(s):  
Martin Peckerar ◽  
Anastasios Tousimis

Solid state x-ray sensing systems have been used for many years in conjunction with scanning and transmission electron microscopes. Such systems conveniently provide users with elemental area maps and quantitative chemical analyses of samples. Improvements on these tools are currently sought in the following areas: sensitivity at longer and shorter x-ray wavelengths and minimization of noise-broadening of spectral lines. In this paper, we review basic limitations and recent advances in each of these areas. Throughout the review, we emphasize the systems nature of the problem. That is. limitations exist not only in the sensor elements but also in the preamplifier/amplifier chain and in the interfaces between these components.Solid state x-ray sensors usually function by way of incident photons creating electron-hole pairs in semiconductor material. This radiation-produced mobile charge is swept into external circuitry by electric fields in the semiconductor bulk.


Author(s):  
J. J. Hren ◽  
S. D. Walck

The field ion microscope (FIM) has had the ability to routinely image the surface atoms of metals since Mueller perfected it in 1956. Since 1967, the TOF Atom Probe has had single atom sensitivity in conjunction with the FIM. “Why then hasn't the FIM enjoyed the success of the electron microscope?” The answer is closely related to the evolution of FIM/Atom Probe techniques and the available technology. This paper will review this evolution from Mueller's early discoveries, to the development of a viable commercial instrument. It will touch upon some important contributions of individuals and groups, but will not attempt to be all inclusive. Variations in instrumentation that define the class of problems for which the FIM/AP is uniquely suited and those for which it is not will be described. The influence of high electric fields inherent to the technique on the specimens studied will also be discussed. The specimen geometry as it relates to preparation, statistical sampling and compatibility with the TEM will be examined.


Sign in / Sign up

Export Citation Format

Share Document