XXXVII. A Comparison of Some Methods for the Determination of Trace Impurities in Semiconductors

1955 ◽  
Vol 1 (3) ◽  
pp. 327-332 ◽  
Author(s):  
A. A. SMALES
Keyword(s):  
Trace Impurities ◽  
Impurities In Semiconductors

scholarly journals Development of decomposition techniques for the determination of trace impurities in high-purity ruthenium metal.

1999 ◽  
Vol 48 (9) ◽  
pp. 835-840 ◽  
Author(s):  
Masamitsu FUKUDA ◽  
Kazutoshi SHIMURA ◽  
Minoru TAKEYA
Keyword(s):  
High Purity ◽  
Decomposition Techniques ◽  
Trace Impurities

scholarly journals Ion Exchange Separation Using a Masking Reagent for the Determination of Trace Impurities in Iron and Steels by ICP-OES

2004 ◽  
Vol 90 (1) ◽  
pp. 48-50 ◽  
Author(s):  
Hitoshi YAMAGUCHI ◽  
Shinji ITOH ◽  
Shin'ichi HASEGAWA ◽  
Kunikazu IDE ◽  
Takeshi KOBAYASHI
Keyword(s):  
Ion Exchange ◽  
Icp Oes ◽  
Trace Impurities ◽  
Ion Exchange Separation

scholarly journals Determination of trace impurities in high-purity molybdenum and tungsten.

DENKI-SEIKO ◽  
1988 ◽  
Vol 59 (4) ◽  
pp. 263-270 ◽  
Author(s):  
Fumikichi Mogi ◽  
Kiyotaka Itoh ◽  
Noriko Okamoto ◽  
Masanao Narita ◽  
Michihiko Fujine
Keyword(s):  
High Purity ◽  
Trace Impurities ◽  
And Tungsten

Determination of trace impurities of chlorine in zirconium-alloy matrices using neutron activation technique

2011 ◽  
Vol 99 (11) ◽  
pp. 751-754 ◽  
Author(s):  
H. Naik ◽  
V. L. Sant ◽  
S. V. Suryanarayana ◽  
P. M. Prajapati ◽  
T. Newton Nathaniel
Keyword(s):  
Neutron Activation ◽  
Zirconium Alloy ◽  
Activation Technique ◽  
Trace Impurities ◽  
Neutron Activation Technique

scholarly journals Determination of trace impurities in sintered silicon carbide and silicon nitride by the pressure acid decomposition/ICP-AES.

1992 ◽  
Vol 41 (12) ◽  
pp. T151-T156 ◽  
Author(s):  
Yoshinori UWAMINO ◽  
Hisashi MORIKAWA ◽  
Akira TSUGE ◽  
Kiyoshi NAKANE ◽  
Yasuo IIDA ◽  
...  
Keyword(s):  
Silicon Carbide ◽  
Silicon Nitride ◽  
Acid Decomposition ◽  
Trace Impurities ◽  
Sintered Silicon
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