Electron–channelling imaging in scanning electron microscopy

Philosophical Magazine A ◽

10.1080/01418617908234856 ◽

1979 ◽

Vol 40 (4) ◽

pp. 511-524 ◽

Author(s):

P. Morin ◽

M. Pitaval ◽

D. Besnard ◽

G. Fontaine

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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A theoretical model for the energy dependence of electron channelling patterns in scanning electron microscopy

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/7/7/310 ◽

1974 ◽

Vol 7 (7) ◽

pp. 1030-1046 ◽

Author(s):

Rolf Sandström ◽

Jonathan F Spencer ◽

Colin J Humphreys

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Theoretical Model ◽

Energy Dependence ◽

Electron Channelling ◽

Scanning Electron

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Electron channelling patterns in scanning electron microscopy

Journal of Materials Science ◽

10.1007/bf02426843 ◽

1977 ◽

Vol 12 (6) ◽

pp. 1071-1087 ◽

Author(s):

E. M. Schulson

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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Scanning electron microscopy-electron channelling contrast investigation of recrystallization during cyclic deformation of ultrafine grained copper processed by equal channel angular pressing

Philosophical Magazine Letters ◽

10.1080/09500830210157117 ◽

2002 ◽

Vol 82 (10) ◽

pp. 559-565 ◽

Author(s):

S. D. Wu ◽

Z. G. Wang ◽

C. B. Jiang ◽

G. Y. Li

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Equal Channel Angular Pressing ◽

Cyclic Deformation ◽

Angular Pressing ◽

Electron Channelling ◽

Ultrafine Grained ◽

Scanning Electron

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Utilization of Electron Channelling Contrast Imaging to Display Crystal Lattice Orientation in Scanning Electron Microscopy

10.22443/rms.emc2020.928 ◽

2021 ◽

Author(s):

Jan Cupera

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Crystal Lattice ◽

Lattice Orientation ◽

Contrast Imaging ◽

Electron Channelling ◽

Scanning Electron

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Investigations of dislocation patterns within grains and near grain boundaries in copper by the electron channelling contrast technique in scanning electron microscopy

Philosophical Magazine Letters ◽

10.1080/095008398178084 ◽

1998 ◽

Vol 78 (2) ◽

pp. 105-113 ◽

Author(s):

Z.F. Zhang ◽

Z. G. Wang

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Grain Boundaries ◽

Electron Channelling ◽

Contrast Technique ◽

Scanning Electron ◽

Dislocation Patterns

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CRYSTALLOGRAPHIC ASPECTS OF SCANNING ELECTRON MICROSCOPY: THE ELECTRON CHANNELLING PATTERN TECHNIQUE

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-015 ◽

1972 ◽

pp. 286-300

Author(s):

E. M. Schulson

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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MEASUREMENT OF THE BAND WIDTH OF ELECTRON CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPY

Acta Physica Sinica ◽

10.7498/aps.27.470 ◽

1978 ◽

Vol 27 (4) ◽

pp. 470

Author(s):

ZHANG JING-GUO

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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Method for Measuring the Incident‐Beam Energy in Scanning Electron Microscopy Using Electron Channelling Patterns

Journal of Applied Physics ◽

10.1063/1.1659703 ◽

1971 ◽

Vol 42 (10) ◽

pp. 3894-3899 ◽

Author(s):

E. M. Schulson

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Beam Energy ◽

Incident Beam ◽

Electron Channelling ◽

Incident Beam Energy ◽

Scanning Electron

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Observations on persistent slip bands transferring through a grain boundary in a copper bicrystal by the electron channelling contrast in scanning electron microscopy technique

Philosophical Magazine Letters ◽

10.1080/095008399177291 ◽

1999 ◽

Vol 79 (5) ◽

pp. 233-240 ◽

Author(s):

Z.F. Zhang ◽

Z.G. Wang ◽

H.H. Su

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Grain Boundary ◽

Scanning Electron Microscopy Technique ◽

Microscopy Technique ◽

Electron Channelling ◽

Persistent Slip Bands ◽

Scanning Electron

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Pathogenesis of Human Hair Defects

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010005007x ◽

1974 ◽

Vol 32 ◽

pp. 12-13

Author(s):

P.S. Porter ◽

T. Aoyagi ◽

R. Matta

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Standard Techniques ◽

Scanning Electron

Using standard techniques of scanning electron microscopy (SEM), over 1000 human hair defects have been studied. In several of the defects, the pathogenesis of the abnormality has been clarified using these techniques. It is the purpose of this paper to present several distinct morphologic abnormalities of hair and to discuss their pathogenesis as elucidated through techniques of scanning electron microscopy.

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