A theoretical model for the energy dependence of electron channelling patterns in scanning electron microscopy

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/7/7/310 ◽

1974 ◽

Vol 7 (7) ◽

pp. 1030-1046 ◽

Author(s):

Rolf Sandström ◽

Jonathan F Spencer ◽

Colin J Humphreys

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Theoretical Model ◽

Energy Dependence ◽

Electron Channelling ◽

Scanning Electron

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Some surface characteristics of articular cartilage—I. A scanning electron microscopy study and a theoretical model for the dynamic interaction of synovial fluid and articular cartilage

Journal of Biomechanics ◽

10.1016/0021-9290(74)90007-4 ◽

1974 ◽

Vol 7 (5) ◽

pp. 449-456 ◽

Author(s):

Van C. Mow ◽

W.Michael Lai ◽

Irving Redler

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Articular Cartilage ◽

Theoretical Model ◽

Synovial Fluid ◽

Surface Characteristics ◽

Microscopy Study ◽

Dynamic Interaction ◽

Electron Microscopy Study ◽

Scanning Electron

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Electron channelling patterns in scanning electron microscopy

Journal of Materials Science ◽

10.1007/bf02426843 ◽

1977 ◽

Vol 12 (6) ◽

pp. 1071-1087 ◽

Author(s):

E. M. Schulson

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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Morphological instability of Cu nanolines induced by Ga+-ion bombardment: In situ scanning electron microscopy and theoretical model

Journal of Applied Physics ◽

10.1063/1.2903881 ◽

2008 ◽

Vol 103 (7) ◽

pp. 074306 ◽

Author(s):

Qiangmin Wei ◽

Weixing Li ◽

Kai Sun ◽

Jie Lian ◽

Lumin Wang

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Theoretical Model ◽

Ion Bombardment ◽

Morphological Instability ◽

Scanning Electron

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Scanning electron microscopy-electron channelling contrast investigation of recrystallization during cyclic deformation of ultrafine grained copper processed by equal channel angular pressing

Philosophical Magazine Letters ◽

10.1080/09500830210157117 ◽

2002 ◽

Vol 82 (10) ◽

pp. 559-565 ◽

Author(s):

S. D. Wu ◽

Z. G. Wang ◽

C. B. Jiang ◽

G. Y. Li

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Equal Channel Angular Pressing ◽

Cyclic Deformation ◽

Angular Pressing ◽

Electron Channelling ◽

Ultrafine Grained ◽

Scanning Electron

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Electron–channelling imaging in scanning electron microscopy

Philosophical Magazine A ◽

10.1080/01418617908234856 ◽

1979 ◽

Vol 40 (4) ◽

pp. 511-524 ◽

Author(s):

P. Morin ◽

M. Pitaval ◽

D. Besnard ◽

G. Fontaine

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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Utilization of Electron Channelling Contrast Imaging to Display Crystal Lattice Orientation in Scanning Electron Microscopy

10.22443/rms.emc2020.928 ◽

2021 ◽

Author(s):

Jan Cupera

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Crystal Lattice ◽

Lattice Orientation ◽

Contrast Imaging ◽

Electron Channelling ◽

Scanning Electron

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Investigations of dislocation patterns within grains and near grain boundaries in copper by the electron channelling contrast technique in scanning electron microscopy

Philosophical Magazine Letters ◽

10.1080/095008398178084 ◽

1998 ◽

Vol 78 (2) ◽

pp. 105-113 ◽

Author(s):

Z.F. Zhang ◽

Z. G. Wang

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Grain Boundaries ◽

Electron Channelling ◽

Contrast Technique ◽

Scanning Electron ◽

Dislocation Patterns

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Theoretical model for scanning electron microscopy through thin film windows

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585371 ◽

1991 ◽

Vol 9 (6) ◽

pp. 3070 ◽

Author(s):

E. D. Green

Keyword(s):

Thin Film ◽

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Theoretical Model ◽

Scanning Electron

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CRYSTALLOGRAPHIC ASPECTS OF SCANNING ELECTRON MICROSCOPY: THE ELECTRON CHANNELLING PATTERN TECHNIQUE

Electron Microscopy and Structure of Materials ◽

10.1525/9780520323230-015 ◽

1972 ◽

pp. 286-300

Author(s):

E. M. Schulson

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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MEASUREMENT OF THE BAND WIDTH OF ELECTRON CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPY

Acta Physica Sinica ◽

10.7498/aps.27.470 ◽

1978 ◽

Vol 27 (4) ◽

pp. 470

Author(s):

ZHANG JING-GUO

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Channelling ◽

Scanning Electron

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