A new study of critical layer thickness, stability and strain relaxation in pseudomorphic gexsi1-xstrained epilayers
1992 ◽
Vol 65
(5)
◽
pp. 1151-1167
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1993 ◽
Vol 36
(3)
◽
pp. 331-337
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2012 ◽
Vol 184-185
◽
pp. 1080-1083
2020 ◽
Vol 3
(11)
◽
pp. 2000138
◽
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