A new study of critical layer thickness, stability and strain relaxation in pseudomorphic gexsi1-xstrained epilayers

1992 ◽  
Vol 65 (5) ◽  
pp. 1151-1167 ◽  
Author(s):  
Suresh C. Jain ◽  
T. J. Gosling ◽  
J. R. Willis ◽  
D. H. J. Totterdell ◽  
R. Bullough
Keyword(s):  
Layer Thickness ◽  
Strain Relaxation ◽  
Critical Layer ◽  
Critical Layer Thickness

Critical layer thickness and strain relaxation measurements in GaSb(001)/AlSb structures

1989 ◽  
Vol 66 (4) ◽  
pp. 1687-1694 ◽  
Author(s):  
H.‐J. Gossmann ◽  
B. A. Davidson ◽  
G. J. Gualtieri ◽  
G. P. Schwartz ◽  
A. T. Macrander ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Strain Relaxation ◽  
Critical Layer ◽  
Critical Layer Thickness ◽  
Relaxation Measurements

Modulation Structure and Superhardness Effect of VC/TiN Nano-Multilayer Films

2012 ◽  
Vol 184-185 ◽  
pp. 1080-1083
Author(s):  
Jian Ling Yue ◽  
Wei Shi ◽  
Ge Yang Li
Keyword(s):  
Elastic Modulus ◽  
Magnetron Sputtering ◽  
Layer Thickness ◽  
Coherent Structure ◽  
Multilayer Films ◽  
Critical Layer ◽  
Maximum Hardness ◽  
Critical Layer Thickness ◽  
The Relationship

A series of VC/TiN nano-multilayer films with various TiN layer thicknesses were synthesized by magnetron sputtering method. The relationship between the modulation structure and superhardness effect of the multilayer films were investigated. The results reveal that TiN below a critical layer thickness grows coherently with VC layers in multilayers. Correspondingly, the hardness and elastic modulus of the multilayers increase significantly. The maximum hardness and modulus achieved in these multilayers is 40.7GPa and 328GPa.With further increase in the TiN layer thickness, coherent structure of multilayers are destroyed, resulting in a remarkable decrease of hardness and modulus. The superhardness effect of multilayers is related to the three directional strains generated from the coherent structure.

Indium incorporation efficiency and critical layer thickness of (202¯1) InGaN layers on GaN

2012 ◽  
Vol 101 (20) ◽  
pp. 202102 ◽  
Author(s):  
Simon Ploch ◽  
Tim Wernicke ◽  
Martin Frentrup ◽  
Markus Pristovsek ◽  
Markus Weyers ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Critical Layer ◽  
Critical Layer Thickness ◽  
Incorporation Efficiency
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