EFFECT OF ANNEALING TEMPERATURE ON LEAKAGE CURRENT CHARACTERISTICS OF Bi3.25La0.75Ti3O12 THIN FILMS PREPARED BY SOL-GEL METHOD

2006 ◽  
Vol 79 (1) ◽  
pp. 97-103 ◽  
Author(s):  
JUN YU ◽  
GUO DONG-YUN ◽  
WANG YUN-BO ◽  
GAO JUN-XIONG
2010 ◽  
Vol 434-435 ◽  
pp. 228-230
Author(s):  
Cheng Hsing Hsu ◽  
Shih Yao Lin ◽  
Hsin Han Tung

This paper describes microstructure and leakage current characteristics of ZrTiO4 thin films on ITO/Glass substrate were deposited by sol-gel method with a fix per-heating temperature of 250oC for 30min at various annealing temperatures from 600oC to 800oC for 1 hr. The annealed films were characterized using X-ray diffraction. The surface morphologies of annealed film were examined by atomic force microscopy. The dependence of the microstructure and leakage current characteristics on annealing temperature was also investigated.


Ionics ◽  
2010 ◽  
Vol 16 (9) ◽  
pp. 815-820 ◽  
Author(s):  
Yidong Zhang ◽  
Wenjun Fa ◽  
Fengling Yang ◽  
Zhi Zheng ◽  
Pingyu Zhang

2015 ◽  
Vol 381 ◽  
pp. 127-130 ◽  
Author(s):  
Hone-Zern Chen ◽  
Ming-Cheng Kao ◽  
San-Lin Young ◽  
Jun-Dar Hwang ◽  
Jung-Lung Chiang ◽  
...  

2017 ◽  
Vol 29 (3) ◽  
pp. 555-558
Author(s):  
F.C. Yu ◽  
J.T. Fu ◽  
H.S. Li ◽  
H.L. Hu ◽  
L. He

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