Effect of rainfall on sea-surface microwave thermal emission

1998 ◽  
Vol 8 (1) ◽  
pp. 103-109
Author(s):  
M G Bulatov ◽  
Yu A Kravtsov ◽  
V G Pungin ◽  
E I Skvortsov
Keyword(s):  
2013 ◽  
Vol 52 (2) ◽  
pp. 507-516 ◽  
Author(s):  
Sungwook Hong ◽  
Inchul Shin

AbstractWind speed is the main factor responsible for the increase in ocean thermal emission because sea surface emissivity strongly depends on surface roughness. An alternative approach to estimate the surface wind speed (SWS) as a function of surface roughness is developed in this study. For the sea surface emissivity, the state-of-the-art forward Fast Microwave Emissivity Model, version 3 (FASTEM-3), which is applicable for a wide range of microwave frequencies at incidence angles of less than 60°, is used. Special Sensor Microwave Imager and Advanced Microwave Scanning Radiometer (AMSR-E) observations are simulated using FASTEM-3 and the Global Data Assimilation and Prediction System operated by the Korea Meteorological Administration. The performance of the SWS retrieval algorithm is assessed by comparing its SWS output to that of the Global Data Assimilation System operated by the National Centers for Environmental Prediction. The surface roughness is computed using the Hong approximation and characteristics of the polarization ratio. When compared with the Tropical Atmosphere–Ocean data, the bias and root-mean-square error (RMSE) of the SWS outputs from the proposed wind speed retrieval algorithm were found to be 0.32 m s−1 (bias) and 0.37 m s−1 (RMSE) for the AMSR-E 18.7-GHz channel, 0.38 m s−1 (bias) and 0.42 m s−1 (RMSE) for the AMSR-E 23.8-GHz channel, and 0.45 m s−1 (bias) and 0.49 m s−1 (RMSE) for the AMSR-E 36.5-GHz channel. Consequently, this research provides an alternative method to retrieve the SWS with minimal a priori information on the sea surface.


Author(s):  
W. T. Pike

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.


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