Atomic structure and core composition of partial dislocations and dislocation fronts in β-SiC by high-resolution transmission electron microscopy

2001 ◽  
Vol 81 (11) ◽  
pp. 1633-1647
Author(s):  
M. Lancin, C. Ragaru, C. Godon
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Atomic Structure ◽  
Partial Dislocations ◽  
Core Composition ◽  
Transmission Electron

Metal-ZnO Interfaces Studied by High Resolution Transmission Electron Microscopy

1996 ◽  
Vol 466 ◽  
Author(s):  
J.Th.M. De Hosson ◽  
W. P. Vellinga ◽  
H. B. Groen ◽  
B. J. Kooi
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Orientation Relationship ◽  
Internal Oxidation ◽  
Atomic Structure ◽  
Orientation Relation ◽  
Partial Dislocations ◽  
Transmission Electron ◽  
The Matrix

ABSTRACTThis paper reports on investigations of Ag-ZnO and Cu-ZnO interfaces, produced by internal oxidation. ZnO precipitates with the wurtzite structure were found showing mainly one orientation relationship (OR) with the matrix. However, closely related ORs were found, rotated by small angles from that orientation relation. The atomic structure of several interfaces surrounding these precipitates was studied and compared using high resolution transmission electron microscopy. This paper focuses on interfaces between low index facets of ZnO and vicinal planes of Ag. These interfaces clearly show relaxations. An interpretation of these relaxations in terms of dissociation of partial dislocations at the interface is put forward.

High-resolution Transmission Electron Microscopy Study of Compositional Effects on the Atomic Structure of Multiferroic PbTi1-xFexO3 Nanopowders

2012 ◽  
Vol 18 (S2) ◽  
pp. 1896-1897
Author(s):  
M.A. Schofield ◽  
S. Sen ◽  
Y. Zou ◽  
S.K. Ray ◽  
P. Guptasarma ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Atomic Structure ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron ◽  
Compositional Effects

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Diffusion, Migration and the Atomic Structure of some Grain Boundaries

1985 ◽  
Vol 57 ◽  
Author(s):  
W. Krakow ◽  
D. A. Smith
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Grain Boundary ◽  
Atomic Structure ◽  
Boundary Diffusion ◽  
Transmission Electron ◽  
Diffusion Migration ◽  
Tilt Boundaries ◽  
And Migration

AbstractThe atomic structure of representative tilt boundaries in gold has been determined by high resolution transmission electron microscopy. Characteristic and varying regions of decreased density and coordination have been identified and related to mechanisms of grain boundary diffusion and migration

Characterization of the Structure and Polarity of Twin Boundaries in GaP

1998 ◽  
Vol 510 ◽  
Author(s):  
Dov Cohent ◽  
D.L. Medlin ◽  
C. Barry Carter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Twin Boundary ◽  
Atomic Structure ◽  
Twin Boundaries ◽  
Planar Defects ◽  
Transmission Electron ◽  
Crystallographic Planes

AbstractThe structure of planar defects in GaP films grown by MBE on Si (110) was investigated by transmission electron microscopy. Growth of GaP films on the (110) surface produced numerous microtwins which formed both first and second order twin boundaries. Using high-resolution transmission electron microscopy, the atomic structure of Σ=3 and Σ=9 twin boundaries were studied. Both the Σ=3 and Σ=9 interfaces were observed to facet along specific crystallographic planes. Geometric models of the Σ=9 {221} twin boundary accounting for different polar bonding configurations were proposed and compared with experimental observations.

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