Light elements quantitative x-ray microanalysis of thin samples in STEM. Absorption correction using EELS data

2003 ◽  
Vol 36 (13) ◽  
pp. 1599-1604 ◽  
Author(s):  
V Banchet ◽  
J Michel ◽  
E Jallot ◽  
D Laurent-Maquin ◽  
G Balossier
Keyword(s):  
Light Elements ◽  
X Ray ◽  
Absorption Correction ◽  
Thin Samples

Absorption correction in electron probe x-ray microanalysis of thin samples

1986 ◽  
Vol 58 (7) ◽  
pp. 1282-1285 ◽  
Author(s):  
A. A. Markowicz ◽  
H. M. Storms ◽  
R. E. Van Grieken
Keyword(s):  
Electron Probe ◽  
X Ray ◽  
Absorption Correction ◽  
Thin Samples

Gaussian ϕ(ρz) curves: Comparison with other models

1990 ◽  
Vol 48 (2) ◽  
pp. 192-193
Author(s):  
Alberto Riveros ◽  
Gustavo Castellano
Keyword(s):  
Good Description ◽  
Bulk Sample ◽  
Incident Electron Energy ◽  
Power Mean ◽  
General Shape ◽  
Ionization Cross ◽  
X Ray ◽  
Mass Absorption ◽  
Absorption Correction ◽  
Image Position

X ray characteristic intensity Ii , emerging from element i in a bulk sample irradiated with an electron beam may be obtained throughwhere the function ϕi(ρz) is the distribution of ionizations for element i with the mass depth ρz, ψ is the take-off angle and μi the mass absorption coefficient to the radiation of element i.A number of models has been proposed for ϕ(ρz), involving several features concerning the interaction of electrons with matter, e.g. ionization cross section, stopping power, mean ionization potential, electron backscattering, mass absorption coefficients (MAC’s). Several expressions have been developed for these parameters, on which the accuracy of the correction procedures depends.A great number of experimental data and Monte Carlo simulations show that the general shape of ϕ(ρz) curves remains substantially the same when changing the incident electron energy or the sample material. These variables appear in the parameters involved in the expressions for ϕ(ρz). A good description of this function will produce an adequate combined atomic number and absorption correction.

point-Analysis Using the Extrapolation Method in the Analytical Electron microscope

1990 ◽  
Vol 48 (2) ◽  
pp. 430-431
Author(s):  
Zenji Horita ◽  
Ryuzo Nishimachi ◽  
Takeshi Sano ◽  
Minoru Nemoto
Keyword(s):  
Electron Microscope ◽  
Extrapolation Method ◽  
X Ray ◽  
Absorption Correction ◽  
Point Analysis ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Data Points ◽  
Identical Composition ◽  
X Ray Absorption

Absorption correction is often required in quantitative x-ray microanalysis of thin specimens using the analytical electron microscope. For such correction, it is convenient to use the extrapolation method[l] because the thickness, density and mass absorption coefficient are not necessary in the method. The characteristic x-ray intensities measured for the analysis are only requirement for the absorption correction. However, to achieve extrapolation, it is imperative to obtain data points more than two at different thicknesses in the identical composition. Thus, the method encounters difficulty in analyzing a region equivalent to beam size or the specimen with uniform thickness. The purpose of this study is to modify the method so that extrapolation becomes feasible in such limited conditions. Applicability of the new form is examined by using a standard sample and then it is applied to quantification of phases in a Ni-Al-W ternary alloy.The earlier equation for the extrapolation method was formulated based on the facts that the magnitude of x-ray absorption increases with increasing thickness and that the intensity of a characteristic x-ray exhibiting negligible absorption in the specimen is used as a measure of thickness.

scholarly journals Possible Pitfalls in the Analysis of Minerals and Loose Materials by Portable XRF, and How to Overcome Them

Minerals ◽  
2020 ◽  
Vol 11 (1) ◽  
pp. 33
Author(s):  
Valérie Laperche ◽  
Bruno Lemière
Keyword(s):  
Fluorescence Spectroscopy ◽  
Laboratory Data ◽  
Data Sets ◽  
Light Elements ◽  
Portable Xrf ◽  
X Ray ◽  
Protective Films ◽  
The Matrix ◽  
Valuable Complement ◽  
Physical Effects

Portable X-ray fluorescence spectroscopy is now widely used in almost any field of geoscience. Handheld XRF analysers are easy to use, and results are available in almost real time anywhere. However, the results do not always match laboratory analyses, and this may deter users. Rather than analytical issues, the bias often results from sample preparation differences. Instrument setup and analysis conditions need to be fully understood to avoid reporting erroneous results. The technique’s limitations must be kept in mind. We describe a number of issues and potential pitfalls observed from our experience and described in the literature. This includes the analytical mode and parameters; protective films; sample geometry and density, especially for light elements; analytical interferences between elements; physical effects of the matrix and sample condition, and more. Nevertheless, portable X-ray fluorescence spectroscopy (pXRF) results gathered with sufficient care by experienced users are both precise and reliable, if not fully accurate, and they can constitute robust data sets. Rather than being a substitute for laboratory analyses, pXRF measurements are a valuable complement to those. pXRF improves the quality and relevance of laboratory data sets.

HIGH-RESOLUTION PIXE USING BRAGG’S SPECTROMETER

1991 ◽  
Vol 01 (03) ◽  
pp. 251-258 ◽  
Author(s):  
M. TERASAWA
Keyword(s):  
High Resolution ◽  
Heavy Ions ◽  
X Rays ◽  
Light Elements ◽  
Element Analysis ◽  
X Ray ◽  
Peak Intensity ◽  
Moderate Energy ◽  
Practical Analysis ◽  
Wavelength Selectivity

K, L, and M X-rays in the wavelengths between 6Å and 130Å generated by the bombardment of 200 keV protons and other heavy ions were measured by means of a wavelength dispersive Bragg’s spectrometer. The X-ray peak intensity was fairly high in general, while the background was very low. The technique was favorably applied to a practical analysis of several light elements (Be, B, C, N, O, and F). Use of moderate-energy heavy ions considering the wavelength selectivity in X-ray generation was effective for the element analysis. The high-resolution spectrometry in the analytical application of ion-induced X-ray generation was found to be useful for the study of fine electronic structure, e.g. satellite and hypersatellite X-ray study, and of the chemical state of materials.

Sign in / Sign up

Export Citation Format

Share Document