Magnetic multilayers of Fe/Au: role of the electron mean free path

1999 ◽  
Vol 11 (30) ◽  
pp. 5717-5722 ◽  
Author(s):  
M A Howson ◽  
B J Hickey ◽  
J Garfield ◽  
J Xu ◽  
P A Ryan ◽  
...  
2001 ◽  
Vol 65 (4) ◽  
pp. 257-272 ◽  
Author(s):  
Ya. K. KHODATAEV ◽  
G. E. MORFILL ◽  
V. N. TSYTOVICH

It is shown that the interaction of dust with neutral plasma particles can lead to attractive forces between dust particles, both in the case where the distance between dust particles is less than the mean free path of neutral particles and in the case where it is greater. The expressions for attractive forces differs in the two limits only by a numerical coefficient. The additional force of dust interaction is found to be due to the neutrals created by recombination of charged plasma particles on the surface of dust particles. The influence of radiative dust cooling on dust–dust interaction is considered.


2000 ◽  
Author(s):  
Taofang Zeng ◽  
Gang Chen

Abstract When electrons sweep through a double-heterojunction structure, there exist thermionic effects at the junctions and thermoelectric effects in the film. While both thermoelectric and thermionic effects have been studied for refrigeration and power generation applications separately, their interplay in heterostructures is not understood. This paper establishes a unified model including both thermionic and thermoelectric processes based on the Boltzmann transport equation for electrons, and the nonequilibrium interaction between electrons and phonons. Approximate solutions are obtained, leading to the electron temperature and Fermi level distributions inside heterostructures and discontinuities at the interfaces as a consequence of the highly nonequilibrium transport when the film thickness is much smaller than the electron mean free path. It is found that when the film thickness is smaller than the mean free path of electrons, the transport of electrons is controlled by thermionic emission. The coexistence of thermoelectric and thermionic effects may increase the power factor when the electron mean free path is comparable to the film thickness.


2001 ◽  
Vol 224 (3) ◽  
pp. 205-209 ◽  
Author(s):  
K. Eid ◽  
D. Portner ◽  
R. Loloee ◽  
W.P. Pratt ◽  
J. Bass

2004 ◽  
Vol 566-568 ◽  
pp. 532-537 ◽  
Author(s):  
N. Barrett ◽  
E.E. Krasovskii ◽  
J.-M. Themlin ◽  
V.N. Strocov

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