Phase transformation between diamond and graphite in preparation of diamonds by pulsed-laser induced liquid-solid interface reaction

ABSTRACTTransient electrical conductance has been used to measure the resolidification velocity in silicon containing implanted solutes. Nonequilibrium segregation of the solutes occurs during the rapid resolidification following pulsed laser melting. The velocity of the liquid-solid interface is observed to depend on the type and concentration of the solute. A 25% reduction in solidification velocity is observed for an implanted indium concentration of three atomic percent. Implanted oxygen is also shown to reduce the solidification velocity. The dependence of the velocity on solute concentration impacts a variety of segregation, trapping and supersaturated solution studies.

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Multiscale Surface Patterning of Zirconia by Picosecond Pulsed Laser Irradiation

Journal of Micro and Nano-Manufacturing ◽

10.1115/1.4046040 ◽

2020 ◽

Vol 8 (1) ◽

Author(s):

Yuka Yamamuro ◽

Tomotaka Shimoyama ◽

Isao Yamashita ◽

Jiwang Yan

Keyword(s):

Phase Transformation ◽

Laser Irradiation ◽

Pulsed Laser ◽

Surface Patterning ◽

Yttria Stabilized Zirconia ◽

Surface Structures ◽

Stabilized Zirconia ◽

Periodic Surface ◽

Thermally Induced ◽

Pulsed Laser Irradiation

Abstract Irradiation of yttria-stabilized zirconia (YSZ) was performed by a picosecond pulsed laser to investigate the possibility for multiscale surface patterning. Nanoscale laser-induced periodic surface structures (LIPSS) were successfully generated inside microscale grooves over a large surface area under specific conditions. A thermally induced phase transformation of YSZ was identified after laser irradiation, and this phase transformation was restrained by reducing the laser power or the number of irradiations. Moreover, it was found that the generation of LIPSS greatly changed the surface wettability of YSZ. These results demonstrated the possibility of creating zirconia hybrid patterns with high functionality, which may expand the applications of YSZ in industry.

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Direct measurements of liquid/solid interface kinetics during pulsed‐laser‐induced melting of aluminum

Applied Physics Letters ◽

10.1063/1.97015 ◽

1986 ◽

Vol 48 (4) ◽

pp. 278-280 ◽

Cited By ~ 36

Author(s):

J. Y. Tsao ◽

S. T. Picraux ◽

P. S. Peercy ◽

Michael O. Thompson

Keyword(s):

Pulsed Laser ◽

Solid Interface ◽

Interface Kinetics ◽

Direct Measurements

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Measurement of Ultrafast Melting and Regrowth Velocities in Pulsed Laser Heated Silicon

MRS Proceedings ◽

10.1557/proc-23-93 ◽

1983 ◽

Vol 23 ◽

Author(s):

Philip H. Bucksbaum ◽

Jeffrey Bokor

Keyword(s):

Laser Fluence ◽

Pulsed Laser ◽

Liquid Films ◽

Heat Diffusion ◽

Solid Interface ◽

Direct Measurements ◽

Laser Heated ◽

Good Agreement

ABSTRACTDirect measurements of the liquid/solid interface veiocity have been made during both melt-in and regrowth for puised (20 psec) ultraviolet lasei irradiation or crystailine silicon. The regrowth velocity was 25 m/sec, independent or laser fluence. Regrowtn velocities of 50 to 100 m/sec are expected from heat diffusion calculations which neglect undercooling, whereas the inclusion of an appropriate undercooling curve brings the calculation into good agreement with the data. Tne liquid films produced were up to 40 nm thick and were fully amorphized on resoliaificaion.

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