The interference effect in an optical beam deflection detection system of a dynamic mode AFM

2006 ◽  
Vol 17 (6) ◽  
pp. 1417-1423 ◽  
Author(s):  
Qiang-Xian Huang ◽  
Ye-Tai Fei ◽  
Satoshi Gonda ◽  
Ichiko Misumi ◽  
Osamu Sato ◽  
...  
Keyword(s):  
Interference Effect ◽  
Detection System ◽  
Optical Beam ◽  
Beam Deflection ◽  
Dynamic Mode

scholarly journals Assessing Automated Facial Action Unit Detection Systems for Analyzing Cross-Domain Facial Expression Databases

Sensors ◽  
2021 ◽  
Vol 21 (12) ◽  
pp. 4222
Author(s):  
Shushi Namba ◽  
Wataru Sato ◽  
Masaki Osumi ◽  
Koh Shimokawa
Keyword(s):  
Affective Computing ◽  
Detection System ◽  
Characteristic Curve ◽  
Unmet Need ◽  
Systematic Evaluation ◽  
Dynamic Mode ◽  
Coding System ◽  
Static Mode ◽  
Action Unit ◽  
Facial Action

In the field of affective computing, achieving accurate automatic detection of facial movements is an important issue, and great progress has already been made. However, a systematic evaluation of systems that now have access to the dynamic facial database remains an unmet need. This study compared the performance of three systems (FaceReader, OpenFace, AFARtoolbox) that detect each facial movement corresponding to an action unit (AU) derived from the Facial Action Coding System. All machines could detect the presence of AUs from the dynamic facial database at a level above chance. Moreover, OpenFace and AFAR provided higher area under the receiver operating characteristic curve values compared to FaceReader. In addition, several confusion biases of facial components (e.g., AU12 and AU14) were observed to be related to each automated AU detection system and the static mode was superior to dynamic mode for analyzing the posed facial database. These findings demonstrate the features of prediction patterns for each system and provide guidance for research on facial expressions.

Development of multi-environment dual-probe atomic force microscopy system using optical beam deflection sensors with vertically incident laser beams

2013 ◽  
Vol 84 (8) ◽  
pp. 083701 ◽  
Author(s):  
Eika Tsunemi ◽  
Kei Kobayashi ◽  
Noriaki Oyabu ◽  
Masaharu Hirose ◽  
Yoshiko Takenaka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Laser Beams ◽  
Beam Deflection ◽  
Incident Laser ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dual Probe

Multi-Probe Atomic Force Microscopy with Optical Beam Deflection Method

2007 ◽  
Vol 46 (8B) ◽  
pp. 5636-5638 ◽  
Author(s):  
Eika Tsunemi ◽  
Nobuo Satoh ◽  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Beam ◽  
Beam Deflection ◽  
Force Microscopy ◽  
Atomic Force

A two-axis in-plane motion measurement system based on optical beam deflection

2013 ◽  
Vol 84 (10) ◽  
pp. 105001 ◽  
Author(s):  
R. Sriramshankar ◽  
R. Sri Muthu Mrinalini ◽  
G. R. Jayanth
Keyword(s):  
Measurement System ◽  
Plane Motion ◽  
Optical Beam ◽  
Beam Deflection ◽  
Motion Measurement

Optical beam deflection signal from a single microparticle

1990 ◽  
Vol 57 (1) ◽  
pp. 22-24 ◽  
Author(s):  
Jiaqi Wu ◽  
Takehiko Kitamori ◽  
Tsuguo Sawada
Keyword(s):  
Optical Beam ◽  
Beam Deflection

Optical beam deflection imaging of the electron beam interaction volume in semiconductors

1993 ◽  
Vol 63 (5) ◽  
pp. 645-647 ◽  
Author(s):  
G. Y. Chang ◽  
R. B. Givens ◽  
J. W. M. Spicer ◽  
R. Osiander ◽  
J. C. Murphy
Keyword(s):  
Electron Beam ◽  
Optical Beam ◽  
Beam Deflection ◽  
Interaction Volume ◽  
Beam Interaction
Sign in / Sign up

Export Citation Format

Share Document