Computational analysis of direct current breakdown process in SF6 at low pressure

Author(s):  
jiamao gao ◽  
Hao Wu ◽  
Shimin Yu ◽  
Zhipeng Chen ◽  
Zhijiang Wang ◽  
...  
2016 ◽  
Vol 25 (2) ◽  
pp. 025025 ◽  
Author(s):  
Efe Kemaneci ◽  
Jean-Paul Booth ◽  
Pascal Chabert ◽  
Jan van Dijk ◽  
Thomas Mussenbrock ◽  
...  

2013 ◽  
Vol 103 (25) ◽  
pp. 254104 ◽  
Author(s):  
Zhiying Chen ◽  
Lee Chen ◽  
Merritt Funk
Keyword(s):  

2020 ◽  
Vol 35 (7) ◽  
pp. 1450-1457
Author(s):  
Gagan Paudel ◽  
Sergey Khromov ◽  
Martin Kasik ◽  
Hans Jørgen Roven ◽  
Marisa Di Sabatino

It is likely that observation of roughness at crater bottom upon GDMS sputtering is due to differential sputtering of grains.


1997 ◽  
Vol 6 (2-4) ◽  
pp. 406-410 ◽  
Author(s):  
J. Laimer ◽  
H. Pauser ◽  
H. Störi ◽  
R. Haubner ◽  
B. Lux

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