X-ray photoelectron spectroscopy and transmission electron microscopy analysis of silver-coated gold nanorods designed for bionanotechnology applications

2016 ◽  
Vol 28 (2) ◽  
pp. 025704 ◽  
Author(s):  
Fumiya Watanabe ◽  
Zeid A Nima ◽  
Takumi Honda ◽  
Masatoshi Mitsuhara ◽  
Minoru Nishida ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Gold Nanorods ◽  
Photoelectron Spectroscopy ◽  
Transmission Electron Microscopy Analysis ◽  
X Ray ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

X-ray diffraction and transmission electron microscopy analysis of ordering and structure in Al1−xInxAs thin films

2000 ◽  
Vol 15 (1) ◽  
pp. 45-55 ◽  
Author(s):  
R. L. Forrest ◽  
J. Kulik ◽  
T. D. Golding ◽  
S. C. Moss
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Short Range ◽  
X Ray Diffraction ◽  
Transmission Electron Microscopy Analysis ◽  
X Ray ◽  
Transmission Electron ◽  
Short Range Ordering ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

This paper presents an x-ray diffraction and transmission electron microscopy analysis of Al1−xInxAs grown by molecular beam epitaxy. Two samples grown on (001) InP at temperatures of 370 and 400 °C are characterized. The first, which contains a high density of twin lamellae, exhibits triple-period short-range ordering with a rather short correlation range normal to the (111) planes. Within these (individual) planes, the concentration, however, is uniform over a considerably greater distance, leading to a highly anisotropic scattering. This is the first observation of triple-period short-range ordering in a sample that exhibits 2 × 1 surface reconstruction. The second sample exhibits CuPt-type short-range ordering with scattering that is significantly streaked, suggestive of lamellar-shaped ordered domains. Both samples contain high densities of stacking faults leading to additional sharp streaking along symmetry-allowed 〈111〉 directions.

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