scholarly journals Scanning probe microscopy analysis of delaminated thin films

2007 ◽  
Vol 61 ◽  
pp. 576-581 ◽  
Author(s):  
Petr Klapetek ◽  
Vilma Buršíková ◽  
Miroslav Valtr
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Microscopy Analysis

Optoeletronic investigation of Cu2ZnSn(S,Se)4 thin-films & Cu2ZnSn(S,Se)4/CdS interface with scanning probe microscopy

2015 ◽  
Vol 59 (2) ◽  
pp. 231-236 ◽  
Author(s):  
Jiangjun Li ◽  
Yugang Zou ◽  
Ting Chen ◽  
Jinsong Hu ◽  
Dong Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

2013 Microscopy Today Innovation Awards

2013 ◽  
Vol 21 (5) ◽  
pp. 40-45
Keyword(s):  
Electron Microscopy ◽  
Light Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Analysis Methods ◽  
Microscopy Analysis ◽  
Ion Microscopy ◽  
Microscopy Techniques

Microscopy Today congratulates the fourth annual group of Innovation Award winners. The ten innovations described below move several microscopy techniques forward: light microscopy, scanning probe microscopy, electron microscopy, ion microscopy, and hybrid microscopy-analysis methods. These innovations will make imaging and analysis more powerful, more flexible, more productive, and easier to accomplish.

Bias assisted scanning probe microscopy direct write lithography enables local oxygen enrichment of lanthanum cuprates thin films

2015 ◽  
Vol 26 (32) ◽  
pp. 325302 ◽  
Author(s):  
Francesco Lavini ◽  
Nan Yang ◽  
Rama K Vasudevan ◽  
E Strelcov ◽  
S Jesse ◽  
...  
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Oxygen Enrichment ◽  
Scanning Probe ◽  
Direct Write ◽  
Probe Microscopy ◽  
Local Oxygen

scholarly journals Scanning Probe Microscopy on heterogeneous CaCu3Ti4O12 thin films

2011 ◽  
Vol 6 (1) ◽  
Author(s):  
Patrick Fiorenza ◽  
Raffaella Lo Nigro ◽  
Vito Raineri
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Scanning probe microscopy study of the growth of YBa2Cu3O7 thin films

1995 ◽  
Vol 53 ◽  
pp. 380-381
Author(s):  
M. Grant Norton ◽  
Rand R. Biggers ◽  
E.K. Moser ◽  
T.L. Peterson ◽  
I. Maartense
Keyword(s):  
Thin Films ◽  
Scanning Probe Microscopy ◽  
Substrate Surface ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Ybco Thin Films ◽  
Nucleation Sites ◽  
Step Flow Growth ◽  
Deposition Conditions

Previous work in our laboratory has demonstrated the use of scanning probe microscopy (SPM) techniques in the study of microstructure development in YBa2Cu3O7 (YBCO) thin films formed by pulsed-laser deposition (PLD) [e.g., Ref. 1]. Under certain deposition conditions a high density of surface outgrowths was observed. These outgrowths have been identified as a-axis-oriented YBCO grains nucleated at the substrate surface which grow in concert with the c-axis-oriented YBCO grains. This growth mechanism differs from that previously suggested for the formation of mixed a-axis-oriented/c-axis-oriented YBCO films. The microstructure of YBCO thin films deposited on vicinal substrates by PLD is very different from that observed for films grown on oriented substrates (even under equivalent deposition conditions). Films grown on vicinal LaA1O3 substrates consisted of elongated granular features oriented along common directions. The shape of these features is the result of step-flow growth where the ledges on the miscut substrates provide aligned and enhanced nucleation sites. Such features have been observed on films grown using several different deposition conditions: only the width of the features changed.

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