scholarly journals Effect of annealing temperature on electrical properties of poly (methyl methacrylate): titanium dioxide nanocomposite films using spin coating deposition technique

Author(s):  
L N Ismail ◽  
Z Habibah ◽  
S H Herman ◽  
M Rusop
2011 ◽  
Vol 312-315 ◽  
pp. 1027-1031
Author(s):  
Mohd Noor Asiah ◽  
Mat Zain Basri ◽  
Mohamad Rusop

This paper investigated the electrical properties of nanostructured Titanium Dioxide (TiO2) thin films prepared by the sol-gel method at different annealing temperatures. The precursor used was Titanium (IV) butoxide at concentration of 0.4 M. The TiO2 thin films were deposited on the glass and silicon substrates by using the spin coating technique. The influence of annealing temperatures on the electrical, structural, surface morphology and optical properties of the films were characterized by I-V measurement, X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and UV-Vis Spectroscopy, respectively. It was found that the electrical properties of TiO2¬ thin films were changed due to the changes of annealing temperatures. As the annealing temperatures rises, the resistivity of the film found to be decreased. The result also shows that films which does not applied annealing temperature called as deposited were found to be amorphous while the films with annealing temperature T = 350oC and above became crystalline structure. The anatase phase can be obtained at annealing temperatures from T = 350oC up to T = 500oC.


2013 ◽  
Vol 667 ◽  
pp. 255-259
Author(s):  
Ismail Lyly Nyl ◽  
Zulkefle Habibah ◽  
Herman Sukreen Hana ◽  
Mohamad Rusop

This paper reported the effect of silane on the electrical properties of the nanocomposite poly(methyl methacrylate): titanium dioxide (PMMA:TiO2) films. Different types of silane were added directly into the nanocomposite PMMA:TiO2 solution. Electrical properties result shows that when different silane were use in the nanocomposite solution give different electrical properties. Sample 1 (without silane) and 4 (trimethoxymethylsilane) shows the highest resistivity and lowest leakage current density. Meanwhile sample 3 (triethoxyvinylsilane) indicate that are not a suitable silane to be added into the nanocomposite PMMA:TiO2 solution because it produce poor insulator behavior.


2021 ◽  
pp. 096739112110147
Author(s):  
Ufuk Abaci ◽  
H Yuksel Guney ◽  
Mesut Yilmazoglu

The effect of plasticizer on dielectric properties of poly(methyl methacrylate) (PMMA)/titanium dioxide (TiO2) composites was investigated. Propylene carbonate (PC) was used as plasticizer in the samples which were prepared with the conventional solvent casting technique. Scanning Electron Microscopy with Energy Dispersive X-Ray Analysis (SEM-EDX) and Differential scanning calorimetry (DSC) analyses and LCR Meter measurements (performed between 300 K and 400 K), were conducted to examine the properties of the composites. With the addition of plasticizer, the thermal properties have changed and the dielectric constant of the composite has increased significantly. The glass transition temperature of pure PMMA measured 121.7°C and this value did not change significantly with the addition of TiO2, however, 112°C was measured in the sample with the addition 4 ml of PC. While the dielectric constant of pure PMMA was 3.64, the ε′ value increased to 5.66 with the addition of TiO2 and reached 12.6 with the addition of 4 ml PC. These changes have been attributed to increase in amorphous ratio that facilitates polymer dipolar and segmental mobility.


2015 ◽  
Vol 7 (45) ◽  
pp. 25464-25472 ◽  
Author(s):  
Hong Dong ◽  
Yelena R. Sliozberg ◽  
James F. Snyder ◽  
Joshua Steele ◽  
Tanya L. Chantawansri ◽  
...  

2014 ◽  
Vol 104 (4) ◽  
pp. 042902 ◽  
Author(s):  
Anju Ahlawat ◽  
S. Satapathy ◽  
Shushmita Bhartiya ◽  
M. K. Singh ◽  
R. J. Choudhary ◽  
...  

2018 ◽  
Vol 5 (1) ◽  
pp. 20-22
Author(s):  
Chandar Shekar B ◽  
Ranjit Kumar R ◽  
Dinesh K.P.B ◽  
Sulana Sundari C ◽  
Punithavathi K

Thin films of poly (methyl methacrylate) (PMMA) were prepared on cleaned glass slides by using spin coating technique. The prepared films were identified by using FTIR spectrum. Surface morphology of the coated films was studied by using SEM and AFM. Both as grown and annealed films showed smooth and amorphous structure. It also revealed the absence of pits, pin holes and dendritic features in the surface. Both as grown and annealed films showed very low RMS roughness value. The morphology analysis revealed that the prepared film could be used as dielectric layer in thin film transistors and as drug delivery system forwound healing.


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