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Performance analysis of nanoscale double gate strained silicon MOSFET with high k dielectric layers
Materials Research Express
◽
10.1088/2053-1591/ab1fca
◽
2019
◽
Vol 6
(8)
◽
pp. 085062
◽
Cited By ~ 1
Author(s):
G Thriveni
◽
Kaustab Ghosh
Keyword(s):
Performance Analysis
◽
Strained Silicon
◽
Double Gate
◽
Dielectric Layers
◽
High K
◽
High K Dielectric
Download Full-text
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Performance Analysis of High- $k$ Dielectric Based Double-gate Carbon Nanotube MOSFET
2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring)
◽
10.1109/piers-spring46901.2019.9017411
◽
2019
◽
Author(s):
Shashi K. Dargar
◽
Viranjay M. Srivastava
Keyword(s):
Carbon Nanotube
◽
Performance Analysis
◽
Double Gate
◽
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◽
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Theoretical analysis and optimization of high-k dielectric layers for designing high-performance and low-power-dissipation nanoscale double-gate MOSFETs
Journal of Computational Electronics
◽
10.1007/s10825-019-01353-z
◽
2019
◽
Vol 18
(3)
◽
pp. 924-940
◽
Cited By ~ 2
Author(s):
G. Thriveni
◽
Kaustab Ghosh
Keyword(s):
Theoretical Analysis
◽
Low Power
◽
Power Dissipation
◽
High Performance
◽
Double Gate
◽
Dielectric Layers
◽
High K
◽
Low Power Dissipation
◽
High K Dielectric
Download Full-text
Medium energy ion scattering for the high depth resolution characterisation of high-k dielectric layers of nanometer thickness
Applied Surface Science
◽
10.1016/j.apsusc.2013.02.003
◽
2013
◽
Vol 281
◽
pp. 8-16
◽
Cited By ~ 5
Author(s):
J.A. van den Berg
◽
M.A. Reading
◽
P. Bailey
◽
T.Q.C. Noakes
◽
C. Adelmann
◽
...
Keyword(s):
Depth Resolution
◽
Medium Energy
◽
Ion Scattering
◽
Dielectric Layers
◽
High K
◽
Medium Energy Ion Scattering
◽
High K Dielectric
◽
Nanometer Thickness
◽
High Depth
Download Full-text
Performance analysis of long Ge channel double gate (DG) p MOSFETs with high-k gate dielectrics based on carrier concentration formulation
Microelectronics Reliability
◽
10.1016/j.microrel.2011.02.004
◽
2011
◽
Vol 51
(6)
◽
pp. 1105-1112
◽
Cited By ~ 6
Author(s):
Swagata Bhattacherjee
◽
Abhijit Biswas
Keyword(s):
Performance Analysis
◽
Carrier Concentration
◽
Gate Dielectrics
◽
Double Gate
◽
High K
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High-k Dielectric Layers for Bioelectronic Applications
IEICE Transactions on Electronics
◽
10.1093/ietele/e91-c.12.1894
◽
2008
◽
Vol E91-C
(12)
◽
pp. 1894-1898
Author(s):
D. BORSTLAP
◽
J. SCHUBERT
◽
W. ZANDER
◽
A. OFFENHAUSSER
◽
S. INGEBRANDT
Keyword(s):
Dielectric Layers
◽
High K
◽
High K Dielectric
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Impact of high-k dielectric on the digital and analog performance on emulation of double-gate UTBB SOI MOSFETs with different ground plane structures
2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)
◽
10.1109/rsm.2015.7354984
◽
2015
◽
Author(s):
Noraini Othman
◽
M. K. Md Arshad
◽
S. N. Sabki
◽
U. Hashim
Keyword(s):
Ground Plane
◽
Double Gate
◽
High K
◽
Analog Performance
◽
High K Dielectric
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Design optimization of high-k dielectric based double-gate MOSFET and it's performance
2015 Annual IEEE India Conference (INDICON)
◽
10.1109/indicon.2015.7443372
◽
2015
◽
Author(s):
Viranjay M. Srivastava
Keyword(s):
Design Optimization
◽
Double Gate
◽
High K
◽
Double Gate Mosfet
◽
High K Dielectric
Download Full-text
Non-Destructive Characterization and Metrology for Ultra-Thin High-k Dielectric Layers
10.1063/1.1622463
◽
2003
◽
Cited By ~ 1
Author(s):
R. Champaneria
Keyword(s):
Dielectric Layers
◽
High K
◽
High K Dielectric
◽
Non Destructive
◽
Non Destructive Characterization
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Behaviour of injected electrons in high-k dielectric layers
Materials Science in Semiconductor Processing
◽
10.1016/j.mssp.2006.10.015
◽
2006
◽
Vol 9
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◽
pp. 985-988
◽
Cited By ~ 1
Author(s):
R. Avichail-Bibi
◽
A. Kiv
◽
T. Maximova
◽
Y. Roizin
◽
D. Fuks
Keyword(s):
Dielectric Layers
◽
High K
◽
High K Dielectric
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Open Circuit Potential Analysis as a Fast Screening Method for the Quality of High-k Dielectric Layers
Solid State Phenomena
◽
10.4028/www.scientific.net/ssp.92.7
◽
2003
◽
Vol 92
◽
pp. 7-10
◽
Cited By ~ 5
Author(s):
Martine Claes
◽
T. Witters
◽
G. Loriaux
◽
S. Van Elshocht
◽
A. Delabie
◽
...
Keyword(s):
Open Circuit Potential
◽
Screening Method
◽
Open Circuit
◽
Potential Analysis
◽
Fast Screening
◽
Dielectric Layers
◽
High K
◽
High K Dielectric
Download Full-text
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