Advantages and Disadvantages of Nephelometric Measurement of Serum Lipids

1974 ◽  
Vol 20 (4) ◽  
pp. 502-504 ◽  
Author(s):  
Daniel M Baer

Abstract Several technical difficulties diminish the usefulness of serum triglyceride estimation by the method of Stone and Thorp [Clin. Chim. Acta 14, 812 (1966)]. An artificial and somewhat unstable material is used in the standardization. Falsely elevated readings caused by scratched cuvettes are a frequent problem. Conventional quality-control procedures cannot be used because stable preparations are not available. Specimen stability is a greater problem than with conventional chemical methods. In spite of these difficulties, the method can be useful, if its limitations are recognized, in measurements made on nonfasting individuals.

Author(s):  
Y. N. Hua ◽  
G. B. Ang ◽  
S. Redkar ◽  
Yogaspari ◽  
Wilma Richter

Abstract In failure analysis of wafer fabrication, currently, three different types of chemical methods including 6:6:1 (Acetic Acid/HNO3/HF), NaOH and Choline are used in removing polysilicon (poly) layer and exposing the gate/tunnel oxide underneath. However, usage is limited due to their disadvantages. For example, 6:6:1 is a relatively fast etchant, but it is difficult to control the etch time and keep the oxide layer intact. Also, while using NaOH to remove poly and expose the silicon oxide, the solution needs to be heated. It is also difficult to etch a poly layer with a WSix or a CoSix silicide using NaOH. In this paper, we will discuss these 3 etchants in terms of their advantages and disadvantages. We will then introduce a new poly etchant, called HB91. HB91 is useful for removing poly to expose the gate/tunnel oxide for identification of related defects. HB91 is actually a mixture of two chemicals namely nitric acid (HNO3) and buffer oxide etchant (BOE) in a 9:1 ratio. The experimental results show that it is highly selective in poly removal with respect to the gate/tunnel oxide and is a suitable poly etchant especially for removing polysilicon with/without WSix and CoSix in the large capacitor structure. Application results of this poly etchant (HB91) will be presented.


Author(s):  
Hua Younan

Abstract In wafer fabrication (Fab), Fluorine (F) based gases are used for Al bondpad opening process. Thus, even on a regular Al bondpad, there exists a low level of F contamination. However, the F level has to be controlled at a lower level. If the F level is higher than the control/spec limits, it could cause F-induced corrosion and Al-F defects, resulting in pad discoloration and NSOP problems. In our previous studies [1-5], the theories, characteristics, chemical and physical failure mechanisms and the root causes of the F-induced corrosion and Al-F defects on Al bondpads have been studied. In this paper, we further study F-induced corrosion and propose to establish an Auger monitoring system so as to monitor the F contamination level on Al bondpads in wafer fabrication. Auger monitoring frequency, sample preparation, wafer life, Auger analysis points, control/spec limits and OOC/OOS quality control procedures are also discussed.


2012 ◽  
Vol 500 ◽  
pp. 715-720
Author(s):  
Jian Guang Li ◽  
Jian Ding ◽  
Huai Jing Jing ◽  
Ying Xue Yao

Accuracy of the Stewart parallel manipulator is utmost important in assembly quality control procedures, and it's also difficult to demonstrate the inner relations quantitatively between errors of pose and of actuators. A novel methodology is proposed in this paper. Firstly the experiment area planning approach is proposed according to the pose and strut symmetries of the manipulator, and the uniform experiment design is conducted to investigate indexes of accuracy sensitivity. The regression equations are established to analyze the significance of various factors according to experiment results.


1986 ◽  
Vol 7 (3) ◽  
pp. 46-65 ◽  
Author(s):  
Pentti M. Rautaharju ◽  
Steven K. Broste ◽  
Ronald J. Prineas ◽  
William J. Eifler ◽  
Richard S. Crow ◽  
...  

2000 ◽  
Vol 113 (2) ◽  
pp. 240-248 ◽  
Author(s):  
Jay J. Ye ◽  
Stephen C. Ingels ◽  
Curtis A. Parvin

2013 ◽  
Author(s):  
Britton Ward ◽  
Chris Cochran

For the 2014-15 Volvo Ocean Race, the organizing authority made a dramatic shift in direction for the next two editions of the race opting to move to a smaller, less expensive yacht built to exceptionally strict one design standards. This paper outlines some of the motivations for this shift and details some of the critical features of the new Volvo Ocean 65 design and how they compare to solutions on the previous Volvo Open 70 yachts. Discussion of the logistical complexities involved in building the fleet of boats in the required time is also discussed. A review of the structural design is included to illustrate the efforts to improve construction efficiency, reduce cost and dramatically improve robustness of the yacht structures while minimizing the weight additions that result. Finally we review some of the extensive quality control procedures and manufacturing technology that has been employed in an effort to achieve a fleet of one design yachts that are as identical as possible.


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