Simulation Study of a Novel Collector-up npn InGaP/GaAs Heterojunction Bipolar Transistor with a p-Type Doping Buried Layer for Current Confinement
Keyword(s):
2006 ◽
Vol 21
(12)
◽
pp. 1728-1732
2000 ◽
Vol 44
(12)
◽
pp. 2265-2271
◽
2015 ◽
Vol 55
(8)
◽
pp. 1180-1186
◽
1988 ◽
Vol 49
(C4)
◽
pp. C4-579-C4-582