scholarly journals High-resolution imaging by scanning electron microscopy of semithin sections in correlation with light microscopy

Microscopy ◽  
2015 ◽  
Vol 64 (6) ◽  
pp. 387-394 ◽  
Author(s):  
Daisuke Koga ◽  
Satoshi Kusumi ◽  
Ryusuke Shodo ◽  
Yukari Dan ◽  
Tatsuo Ushiki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Light Microscopy ◽  
High Resolution Imaging ◽  
Semithin Sections ◽  
Resolution Imaging ◽  
Scanning Electron

Practical method for high-resolution imaging of polymers by low-voltage scanning electron microscopy

Scanning ◽  
2004 ◽  
Vol 26 (3) ◽  
pp. 122-130 ◽  
Author(s):  
Cedric Gaillard ◽  
Pierre A. Stadelmann ◽  
Christopher J. G. Plummer ◽  
Gilbert Fuchs
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Low Voltage ◽  
Practical Method ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Voltage Scanning ◽  
Scanning Electron

Examination of Schistosome Cercariae and Schistosomules by Scanning Electron Microscopy

1969 ◽  
Vol 27 ◽  
pp. 50-51
Author(s):  
D. Johnson ◽  
P. Moriearty
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Light Microscopy ◽  
Surface Structure ◽  
Extensive Study ◽  
Scanning Microscopy ◽  
Host Parasite ◽  
Conventional Electron Microscopy ◽  
Scanning Electron

Since several species of Schistosoma, or blood fluke, parasitize man, these trematodes have been subjected to extensive study. Light microscopy and conventional electron microscopy have yielded much information about the morphology of the various stages; however, scanning electron microscopy has been little utilized for this purpose. As the figures demonstrate, scanning microscopy is particularly helpful in studying at high resolution characteristics of surface structure, which are important in determining host-parasite relationships.

High Resolution Fesem Study of Au Particle Growth on TiO2

1997 ◽  
Vol 3 (S2) ◽  
pp. 405-406
Author(s):  
F. Cosandey ◽  
L. Zhang ◽  
T. E. Madey
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Surface Science ◽  
Particle Growth ◽  
Crystal Surfaces ◽  
Single Crystal Surfaces ◽  
Sensitivity And Selectivity ◽  
Resolution Imaging ◽  
Scanning Electron

Transition metals supported on oxides have important catalytic properties and are also used in chemical gas sensors for increasing sensitivity and selectivity. In order to understand growth and reactivity in the Au/TiO2 system, we have performed surface studies on a model system consisting of ultrathin, discontinuous Au films on TiO2 (110) single crystals. In this paper we are presenting results obtained by high resolution scanning electron microscopy (HRSEM) on the effects of substrate temperature and average Au thickness on particle size, density and coverage.The TiO2 (110) single crystal surfaces used in this study were prepared in UHV using surface science tools followed by in-situ Au deposition for different substrate temperatures and for various film thicknesses. After deposition, the samples were transferred in air to the Field Emission Scanning Electron microscope (LEO 982 Gemini) for high resolution imaging.Typical high resolution scanning electron microscopy (HRSEM) images of Au films deposited at 300 K are shown in Fig. 1 for two film thicknesses of 0.22 and 1.0 nm.

Characterization of a peg-like terminal NOR structure with light microscopy and high-resolution scanning electron microscopy

Chromosoma ◽  
2005 ◽  
Vol 115 (1) ◽  
pp. 50-59 ◽  
Author(s):  
Elizabeth Schroeder-Reiter ◽  
Andreas Houben ◽  
Jürke Grau ◽  
Gerhard Wanner
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Light Microscopy ◽  
Scanning Electron

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

High Resolution Scanning Electron Microscopy

1991 ◽  
Vol 49 ◽  
pp. 478-479
Author(s):  
David Joy ◽  
James Pawley
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Beam ◽  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Electron Probe ◽  
Impact Point ◽  
Interaction Volume ◽  
Scanning Electron

The scanning electron microscope (SEM) builds up an image by sampling contiguous sub-volumes near the surface of the specimen. A fine electron beam selectively excites each sub-volume and then the intensity of some resulting signal is measured. The spatial resolution of images made using such a process is limited by at least three factors. Two of these determine the size of the interaction volume: the size of the electron probe and the extent to which detectable signal is excited from locations remote from the beam impact point. A third limitation emerges from the fact that the probing beam is composed of a finite number of discrete particles and therefore that the accuracy with which any detectable signal can be measured is limited by Poisson statistics applied to this number (or to the number of events actually detected if this is smaller).

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