A digital scanning Auger electron microscope incorporating a concentric hemispherical analyser

1977 ◽  
Vol 357 (1689) ◽  
pp. 213-230 ◽  
Keyword(s):  
Electron Microscope ◽  
Electron Gun ◽  
Resolving Power ◽  
Electrostatic Lenses ◽  
Different Types ◽  
Digitally Controlled ◽  
Digital Scanning ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A scanning electron microscope with a field-emitting electron gun, digitally controlled scanning and a concentric hemispherical energy analyser is described and compared with different types of energy dispersive scanning electron microscopes. The advantages of hemispherical analysers accessed by electrostatic lenses are flexible electron optical control of working distances and resolving power. A 4 element lens is described which results in an analyser with a 2 eV window over an energy range of 20 eV to 800 eV. Auger images of calcium and sulphur on titanium are given. Spatial resolutions of 50 nm and frame scan times of a few minutes are possible.

scholarly journals Ultrastructure of cleistothecia and the stages of life cycle of Microsphaera palczewskii by scanning electron microscope

2014 ◽  
Vol 32 (2) ◽  
pp. 275-278
Author(s):  
Joanna Z. Kadłubowska ◽  
Ewa Kalinowska-Kucharska
Keyword(s):  
Electron Microscope ◽  
Life Cycle ◽  
Scanning Electron Microscope ◽  
Scanning Microscopy ◽  
Developmental Cycle ◽  
Central Poland ◽  
Caragana Arborescens ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

Several year long investigations of the developmental cycle of <i>Microsphaera palczewskii</i> occurring on the leaves of <i>Caragana arborescens</i> in Central Poland are reported. The material was studied with light and scanning electron microscopes. The scanning microscopy micrographs of the clistothecia and appendages presented in this report are the first micrographs of this species.

scholarly journals Scanning electron microscope fine tuning using four-bar piezoelectric actuated mechanism

2018 ◽  
Vol 69 (1) ◽  
pp. 24-31
Author(s):  
Khaled S. Hatamleh ◽  
Qais A. Khasawneh ◽  
Adnan Al-Ghasem ◽  
Mohammad A. Jaradat ◽  
Laith Sawaqed ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Inverse Kinematic ◽  
Fine Tuning ◽  
Electron Microscopes ◽  
Tuning Strategy ◽  
Scanning Electron Microscopes ◽  
Fine Tune ◽  
Kinematic Solution ◽  
Scanning Electron

Abstract Scanning Electron Microscopes are extensively used for accurate micro/nano images exploring. Several strategies have been proposed to fine tune those microscopes in the past few years. This work presents a new fine tuning strategy of a scanning electron microscope sample table using four bar piezoelectric actuated mechanisms. The introduced paper presents an algorithm to find all possible inverse kinematics solutions of the proposed mechanism. In addition, another algorithm is presented to search for the optimal inverse kinematic solution. Both algorithms are used simultaneously by means of a simulation study to fine tune a scanning electron microscope sample table through a pre-specified circular or linear path of motion. Results of the study shows that, proposed algorithms were able to minimize the power required to drive the piezoelectric actuated mechanism by a ratio of 97.5% for all simulated paths of motion when compared to general non-optimized solution.

The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope

1997 ◽  
Vol 3 (S2) ◽  
pp. 1243-1244 ◽  
Author(s):  
Raynald Gauvin ◽  
Steve Yue
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Incident Electron Energy ◽  
Beam Diameter ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV with probe diameter smaller than 5 nm. At 1 keV, the electron range is 60 nm in aluminum and 10 nm in iron (computed using the CASINO program). Since the electron beam diameter is smaller than 5 nm at 1 keV, the resolution of these microscopes becomes closer to that of TEM.

Analysis of Interesting Materials in the Environmental SEM: You Put What in Your Microscope?

2001 ◽  
Vol 7 (S2) ◽  
pp. 776-777
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Microscope ◽  
Chemical Engineering ◽  
Materials Science ◽  
Variable Pressure ◽  
Environmental Scanning ◽  
Specimen Preparation ◽  
Wide Range ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

The environmental scanning electron microscope (ESEM™) and variable pressure electron microscope (VPSEM) have become accepted tools in the contemporary electron microscopy facility. Their flexibility and their ability to image almost any sample with little, and often no, specimen preparation has proved so attractive that each manufacturer of scanning electron microscopes now markets a low vacuum model.The University of Michigan Electron Microbeam Analysis Laboratory (EMAL) operates two variable pressure instruments, an ElectroScan E3 ESEM and a Hitachi S3200N VPSEM. The E3 ESEM was acquired in the early 1990s with funding from the Amoco Foundation and it has been used to examine an extremely wide variety of different materials. Since EMAL serves the entire university community, and offers support to neighboring institutions and local industry, the types of materials examined span a wide range. There are users from Materials Science & Engineering, Chemical Engineering, Nuclear Engineering, Electrical Engineering, Physics, Chemistry, Geology, Biology, Biophysics, Pharmacy and Pharmacology.

The Morphology of Obliterative Arterial Diseases in Statu Nascendi

1979 ◽  
Author(s):  
M. Marshall ◽  
J. Staubesand ◽  
H. Hese
Keyword(s):  
Risk Factors ◽  
Electron Microscope ◽  
Blood Platelet ◽  
Arterial Disease ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Mini Pigs ◽  
Scanning Electron ◽  
Blood Platelet Aggregation

The arteries of mini pigs which had been exposed to the local or systemic action of recognised ‘risk factors’ for arterial disease were examined with the light microscope, and the transmission and scanning electron microscopes. Initially the scanning instrument revealed adhesions of platelets in different stages of development, but showed an apparently intact endothelium. With the transmission electron microscope, however, degenerative changes in the endothelium could be observed. Increased blood platelet aggregation was also present. After a few weeks we could see a remarkable focal thickening of the intima, together with deposits on the endothelium of platelets, erythrocytes and fibrin (“mixed microparietal thrombosis”). After 6 months fully developed arteriosclerosis of the abdominal aorta had appeared.

Choosing a Scanning Electron Microscope

1998 ◽  
Vol 4 (S2) ◽  
pp. 896-897
Author(s):  
W. A. Lambe ◽  
P.M. Brady
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Selection Process ◽  
The Other ◽  
Hard Data ◽  
Methodical Approach ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
First Time ◽  
Scanning Electron

The variety of instrumentation available to the researcher today can be overwhelming and confusing. Scanning Electron Microscopes (“SEM's) are no exception, and choosing one can often serve as an exercise in dealing with complexity. First time purchasers are most at risk, being subject to a barrage of information that attempts to sway the purchaser in one direction or the other. As a result, one can sometimes be drawn to the details of the latest “high end” performance parameter, while overlooking the basics. At its worst, the selection process can degrade to one of vague guesswork with little hard data to serve as a compass.By applying a methodical approach to define your individual requirements, carefully designed tests of actual instruments, and discussions with your collaborators, potential and experienced users, one can begin to ensure a successful selection process.

Mini-Scanning Electron Miscroscope Concept

1974 ◽  
Vol 32 ◽  
pp. 406-407
Author(s):  
Donald J. Evins ◽  
Robert J. Engle
Keyword(s):  
Electron Microscope ◽  
Depth Of Field ◽  
X Ray ◽  
Rapid Scan ◽  
Operational Characteristics ◽  
Electron Microscopes ◽  
The Cost ◽  
Scanning Electron Microscopes ◽  
Large Research ◽  
Scanning Electron

The scanning electron microscope has already established itself as one of the most useful instrument developments in recent years. The SEM provides 20 times greater useful magnifications and up to 500 times greater depth of-field than the best optical microscopes. Until the introduction of the Mini-SEM concept, the cost and complexity of SEM's has limited their use primarily to large research oriented laboratories.Design features, specifications, and operational characteristics will be reviewed. The Mini-Rapid Scan with resolution of 750Å will be described, along with the Mini-SEM with resolution of 150 to 200Å. Both of these are table top scanning electron microscopes. Various specimen stage options will be illustrated. Other accessories extending the SEM's versatility will be described, such as the energy dispersive x-ray system

A High Resolution Dual Gun Electron Miscroscope for TEM and SEM

1974 ◽  
Vol 32 ◽  
pp. 422-423
Author(s):  
P. S. Ong ◽  
C. L. Gold
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Spot Size ◽  
Resolving Power ◽  
Objective Lens ◽  
Scanning System ◽  
Transmission Electron ◽  
Mode Of Operation ◽  
Electron Microscopes ◽  
Scanning Electron

Transmission electron microscopes (TEM) have the capability of producing an electron spot (probe) with a diameter equal to its resolving power. Inclusion of the required scanning system and the appropriate detectors would therefore easily convert such an instrument into a high resolution scanning electron microscope (SEM). Such an instrument becomes increasingly useful in the transmission mode of operation since it allows the use of samples which are considered too thick for conventional TEM. SEM accessories now available are all based on the use of the prefield of the objective lens to focus the beam. The lens is operated either as a symmetrical Ruska lens or its asymmetrical version. In these approaches, the condensor system of the microscope forms part of the reducing optics and the final spot size is usually larger than 20Å.

Considerations in Making Stereo Micrographs With the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 234-235
Author(s):  
E. R. Walter
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Three Dimensional ◽  
Spatial Relationships ◽  
Additional Information ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

The information obtainable with the scanning electron microscope can often be increased severalfold through the use of stereomicrograph pairs. Not only is the detail which can be observed the equivalent of a 2X increase in magnification over that apparent in a single micrograph, but, threedimensional spatial relationships are more accurately preserved. This is especially true where protruding or pyramided fine structure and/or gross reentrance exists. Since stereo micrographs are conveniently obtained with most scanning electron microscopes, it is generally desirable to add the additional information they offer whenever the three-dimensional relationships present in the specimen'are not readily apparent.

Sign in / Sign up

Export Citation Format

Share Document