Electrical activity of thePtH2complex in silicon: High-resolution Laplace deep-level transient spectroscopy and uniaxial-stress technique

2006 ◽  
Vol 73 (19) ◽  
Author(s):  
Vl. Kolkovsky ◽  
O. Andersen ◽  
L. Dobaczewski ◽  
A. R. Peaker ◽  
K. Bonde Nielsen
Keyword(s):  
High Resolution ◽  
Electrical Activity ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Uniaxial Stress ◽  
Transient Spectroscopy

scholarly journals Studies of Deep Level Transient Spectroscopy of DX Centers in GaAlAs:Te under Uniaxial Stress

1992 ◽  
Vol 83-87 ◽  
pp. 853-858
Author(s):  
Ming Fu Li ◽  
Peter Y. Yu ◽  
Eicke R. Weber ◽  
E. Bauser ◽  
W.L. Hansen ◽  
...  
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Uniaxial Stress ◽  
Dx Centers ◽  
Transient Spectroscopy

High resolution deep level transient spectroscopy applied to extended defects in silicon

2005 ◽  
Vol 17 (22) ◽  
pp. S2219-S2227 ◽  
Author(s):  
J H Evans-Freeman ◽  
D Emiroglu ◽  
K D Vernon-Parry ◽  
J D Murphy ◽  
P R Wilshaw
Keyword(s):  
High Resolution ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Extended Defects ◽  
Transient Spectroscopy

High resolution Laplace deep level transient spectroscopy studies of electron and hole traps in n-type GaN

2008 ◽  
Vol 5 (6) ◽  
pp. 1482-1484 ◽  
Author(s):  
D. Emiroglu ◽  
J. Evans-Freeman ◽  
M. J. Kappers ◽  
C. McAleese ◽  
C. J. Humphreys
Keyword(s):  
High Resolution ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Transient Spectroscopy ◽  
Spectroscopy Studies ◽  
Electron And Hole Traps
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