X-ray absorption spectroscopy of vanadium dioxide thin films across the phase-transition boundary

2007 ◽  
Vol 75 (19) ◽  
Author(s):  
Dmitry Ruzmetov ◽  
Sanjaya D. Senanayake ◽  
Shriram Ramanathan
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Absorption Spectroscopy ◽  
Vanadium Dioxide ◽  
X Ray ◽  
Transition Boundary ◽  
X Ray Absorption ◽  
Vanadium Dioxide Thin Films ◽  
Phase Transition Boundary

scholarly journals Local dynamics and phase transition in quantum paraelectric SrTiO3studied by TiK-edge x-ray absorption spectroscopy

2016 ◽  
Vol 712 ◽  
pp. 012101 ◽  
Author(s):  
Andris Anspoks ◽  
Janis Timoshenko ◽  
Juris Purans ◽  
Francesco Rocca ◽  
Vladimir Trepakov ◽  
...  
Keyword(s):  
Phase Transition ◽  
Absorption Spectroscopy ◽  
Local Dynamics ◽  
X Ray ◽  
Quantum Paraelectric ◽  
X Ray Absorption

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption

X-ray Absorption Spectroscopy Study of TiO2–x Thin Films for Memory Applications

2015 ◽  
Vol 119 (8) ◽  
pp. 4362-4370 ◽  
Author(s):  
D. Carta ◽  
G. Mountjoy ◽  
A. Regoutz ◽  
A. Khiat ◽  
A. Serb ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Memory Applications ◽  
X Ray Absorption

Effect of hydrogenation on the metal-semiconductor phase transition in vanadium dioxide thin films

2007 ◽  
Vol 49 (12) ◽  
pp. 2318-2322 ◽  
Author(s):  
V. N. Andreev ◽  
V. M. Kapralova ◽  
V. A. Klimov
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Vanadium Dioxide ◽  
Vanadium Dioxide Thin Films

scholarly journals Mg/W-codoped vanadium dioxide thin films with enhanced visible transmittance and low phase transition temperature

2015 ◽  
Vol 3 (26) ◽  
pp. 6771-6777 ◽  
Author(s):  
Ning Wang ◽  
Shiyu Liu ◽  
X. T. Zeng ◽  
Shlomo Magdassi ◽  
Yi Long
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Transition Temperature ◽  
Charge Carrier ◽  
Band Gap ◽  
Phase Transition Temperature ◽  
Vanadium Dioxide ◽  
Visible Transmittance ◽  
Vanadium Dioxide Thin Films

Mg2+ and W6+ cations were first codoped into the VO2 lattice, resulting in a widened photon band gap and h+/e− charge carrier accumulation. These effects enhanced the thermochromic performance with a high visible transmission (∼80%) and a low phase transition temperature (∼30 °C).

scholarly journals Speciation and Lability of Ag-, AgCl-, and Ag2S-Nanoparticles in Soil Determined by X-ray Absorption Spectroscopy and Diffusive Gradients in Thin Films

2014 ◽  
Vol 49 (2) ◽  
pp. 897-905 ◽  
Author(s):  
R. Sekine ◽  
G. Brunetti ◽  
E. Donner ◽  
M. Khaksar ◽  
K. Vasilev ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
X Ray ◽  
Ag2s Nanoparticles ◽  
Diffusive Gradients ◽  
X Ray Absorption

Observation of phase transition of cesium manganese hexacyanoferrates by X-ray absorption spectroscopy

2007 ◽  
Vol 68 (11) ◽  
pp. 2158-2161 ◽  
Author(s):  
Kotaro Ishiji ◽  
Tomoyuki Matsuda ◽  
Hiroko Tokoro ◽  
Toshiaki Iwazumi ◽  
Kazuhito Hashimoto ◽  
...  
Keyword(s):  
Phase Transition ◽  
Absorption Spectroscopy ◽  
X Ray ◽  
X Ray Absorption

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Noritake Isomura ◽  
Keiichiro Oh-ishi ◽  
Naoko Takahashi ◽  
Satoru Kosaka
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Absorption Spectroscopy ◽  
Electron Spectroscopy ◽  
Practical Method ◽  
Decay Length ◽  
Total Electron ◽  
X Ray ◽  
Logarithmic Equation ◽  
X Ray Absorption

Thin films formed on surfaces have a large impact on the properties of materials and devices. In this study, a method is proposed using X-ray absorption spectroscopy to derive the film thickness of a thin film formed on a substrate using the spectral separation and logarithmic equation, which is a modified version of the formula used in electron spectroscopy. In the equation, the decay length in X-ray absorption spectroscopy is longer than in electron spectroscopy due to a cascade of inelastic scattering of electrons generated in a solid. The modification factor, representing a multiple of the decay length, was experimentally determined using oxidized Si and Cu with films of thickness 19 nm and 39 nm, respectively. The validity of the proposed method was verified, and the results indicated that the method can be used in the analysis of various materials with thin films.

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