scholarly journals Real-space Green’s function approach to resonant inelastic x-ray scattering

2011 ◽  
Vol 83 (23) ◽  
Author(s):  
J. J. Kas ◽  
J. J. Rehr ◽  
J. A. Soininen ◽  
P. Glatzel
2013 ◽  
Vol 430 ◽  
pp. 012003 ◽  
Author(s):  
Joshua Kas ◽  
John Rehr ◽  
Moniek Tromp ◽  
Rowena J Thomas ◽  
Pieter Glatzel

Author(s):  
Jonathan Almer

Acquisition of microstructural information during realistic service conditions is an ongoing need for fundamental materials insight and computational input. In addition, for engineering applications it is often important to be able to study materials over a wide range of penetration depths, from the surface to bulk. In this presentation we discuss developments at the Sector 1-ID beamline of the Advanced Photon Source (APS) to utilize high-energy x-ray scattering for such studies. The use of high-energies (~80 keV) provides a highly penetrating probe, with sampling depths up to several mm in most materials. Through the development and use of high-energy optics, we can perform both small- and wide-angle scattering (SAXS/WAXS), to probe a large range of sample dimensions in reciprocal space (ranging from Angstroms to hundreds of nanometers), with real space resolutions ranging from microns to mm.


2018 ◽  
Vol 98 (2) ◽  
Author(s):  
Yuya Shinohara ◽  
Wojciech Dmowski ◽  
Takuya Iwashita ◽  
Bin Wu ◽  
Daisuke Ishikawa ◽  
...  

2019 ◽  
Vol 100 (3) ◽  
Author(s):  
Yuya Shinohara ◽  
Wojciech Dmowski ◽  
Takuya Iwashita ◽  
Bin Wu ◽  
Daisuke Ishikawa ◽  
...  

2013 ◽  
Vol 46 (1) ◽  
pp. 165-172 ◽  
Author(s):  
Xinhui Lu ◽  
Kevin G. Yager ◽  
Danvers Johnston ◽  
Charles T. Black ◽  
Benjamin M. Ocko

Determination of the three-dimensional order in thin nanostructured films remains challenging. Real-space imaging methods, including electron microscopies and scanning-probe methods, have difficulty reconstructing the depth of a film and suffer from limited statistical sampling. X-ray and neutron scattering have emerged as powerful complementary techniques but have substantial data collection and analysis challenges. This article describes a new method, grazing-incidence transmission small-angle X-ray scattering, which allows for fast scattering measurements that are not burdened by the refraction and reflection effects that have to date plagued grazing-incidence X-ray scattering. In particular, by arranging a sample/beam geometry wherein the scattering exits through the edge of the substrate, it is possible to record scattering images that are well described by straightforward (Born approximation) scattering models.


2014 ◽  
Vol 70 (a1) ◽  
pp. C1329-C1329
Author(s):  
Michael Sztucki ◽  
Manfred Burghammer ◽  
Oleg Konovalov ◽  
Edward Mitchell ◽  
Theyencheri Narayanan

Consumer products based on soft matter technology often exhibit macroscopic properties which are strongly dependent on their micro- and nano-structures extending over multiple size scales. Synchrotron scattering techniques are ideally suited for probing these multilevel structures and deliver complementary and in some cases unique information as compared to real space methods like confocal microscopy, cryo-electron microscopy or atomic force microscopy. The European Synchrotron Radiation Facility (ESRF) is a world-leading synchrotron light source which operates several state-of-the-art instruments for the investigation of soft materials and offers expertise to academic and industrial users. Fast and flexible access for proprietary experiments with a modular, fine-tuned service is guaranteed. A range of dedicated sample environments which mimic industrial processing conditions are available. This presentation will illustrate the state-of-the-art performance of the following synchrotron scattering techniques by recent examples of industrial relevance. Simultaneous small and wide angle X-ray scattering (SAXS/WAXS) is a powerful method to determine the microstructure and phase behavior of multi-component systems like detergents, food products, pharmaceutical components, polymer composites, etc. The high photon flux translates to high throughput measurements, while the high degree of collimation and resolution permit to elucidate a wide range of length scales from a few Angstroms up to micron scale. Scanning microbeam SAXS/WAXS and single micro-crystal/fiber diffraction (µXRD) allows elucidating the local nanostructure of very small objects like micro-specimens of composite organic/inorganic materials, teeth, bones, micromechanical parts, polymer fibers, micro fluidics, etc. with micro/nanometric real space resolution. X-ray reflectivity (XR) and grazing incidence diffraction/scattering (GID /GISAXS) can reveal the nanoscale structure and complexity of nano-structured complex fluids at interfaces, organic films, biological membranes, etc.


Sign in / Sign up

Export Citation Format

Share Document