scholarly journals Characterization of rarefaction waves in van der Waals fluids

2015 ◽  
Vol 92 (6) ◽  
Author(s):  
Albert Yuen ◽  
John J. Barnard
Keyword(s):  
Van Der Waals ◽  
Rarefaction Waves ◽  
Van Der Waals Fluids

scholarly journals Large-area van der Waals epitaxy and magnetic characterization of Fe3GeTe2 films on graphene

2D Materials ◽  
2021 ◽  
Author(s):  
Joao Marcelo Jordao Lopes ◽  
Dietmar Czubak ◽  
Eugenio Zallo ◽  
Adriana I. Figueroa ◽  
Charles Guillemard ◽  
...  
Keyword(s):  
Van Der Waals ◽  
Large Area ◽  
Magnetic Characterization

Theoretical characterization of the electronic properties of heterogeneous vertical stacks of 2D metal dichalcogenides containing one doped layer

2020 ◽  
Vol 22 (25) ◽  
pp. 14088-14098
Author(s):  
Amine Slassi ◽  
David Cornil ◽  
Jérôme Cornil
Keyword(s):  
Transition Metal ◽  
Electronic Properties ◽  
Van Der Waals ◽  
Transition Metal Dichalcogenides ◽  
Optoelectronic Devices ◽  
Metal Dichalcogenides ◽  
Theoretical Characterization ◽  
New Generation

The rise of van der Waals hetero-structures based on transition metal dichalcogenides (TMDs) opens the door to a new generation of optoelectronic devices.

scholarly journals Efficient growth and characterization of one-dimensional transition metal tellurides inside carbon nanotubes

Nanoscale ◽  
2020 ◽  
Vol 12 (33) ◽  
pp. 17185-17190 ◽  
Author(s):  
Naoyuki Kanda ◽  
Yusuke Nakanishi ◽  
Dan Liu ◽  
Zheng Liu ◽  
Tsukasa Inoue ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Transition Metal ◽  
Van Der Waals ◽  
One Dimensional ◽  
Van Der Waals Materials

Confinement of van der Waals materials inside 1D carbon nanotubes leads to properties not observed in the bulk.

Shock waves by a kinetic model of van der Waals fluids

ARI ◽  
1999 ◽  
Vol 51 (3) ◽  
pp. 203-215 ◽  
Author(s):  
B. Kaźmierczak ◽  
K. Piechór
Keyword(s):  
Kinetic Model ◽  
Shock Waves ◽  
Van Der Waals ◽  
Van Der Waals Fluids

scholarly journals Secondary ion mass spectrometry investigation of carbon grain formation in boron nitride epitaxial layers with atomic depth resolution

2019 ◽  
Vol 34 (5) ◽  
pp. 848-853 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Piotr Caban ◽  
Jacek Baranowski
Keyword(s):  
Mass Spectrometry ◽  
Boron Nitride ◽  
Secondary Ion Mass Spectrometry ◽  
Van Der Waals ◽  
Depth Resolution ◽  
Atomic Resolution ◽  
Epitaxial Layers ◽  
Grain Formation ◽  
Secondary Ion

A refined SIMS procedure allows reaching atomic resolution and characterization of each layer in van der Waals structures separately.

Sign in / Sign up

Export Citation Format

Share Document