Anomalous X-Ray Yields under Surface Wave Resonance during Reflection High Energy Electron Diffraction and Adatom Site Determination

2000 ◽  
Vol 84 (19) ◽  
pp. 4389-4392 ◽  
Author(s):  
Toshiro Yamanaka ◽  
Shozo Ino
Keyword(s):  
Surface Wave ◽  
Electron Diffraction ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray ◽  
Wave Resonance

ELECTRON STANDING WAVES AT A SURFACE DURING REFLECTION HIGH ENERGY ELECTRON DIFFRACTION AND APPLICATION TO STRUCTURE ANALYSIS

2000 ◽  
Vol 14 (21) ◽  
pp. 2171-2222
Author(s):  
TOSHIRO YAMANAKA ◽  
SHOZO INO
Keyword(s):  
Electron Diffraction ◽  
Structure Analysis ◽  
Standing Waves ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
Surface Electron ◽  
X Ray ◽  
Wave Resonance ◽  
Glancing Angle

During observation of reflection high energy electron diffraction (RHEED), the interference between the incident and diffracted beams leads to the formation of surface electron standing waves. Characteristic X-ray emission is strongly excited if the atom exists in a strong wave field. Therefore, X-ray yields depends on the position of the atom and incident glancing angle (θg) of the electron beam, since the distribution of these waves changes with θg. Such anomalous intensities of X-ray emission are clearly observed under both Bragg and surface wave resonance conditions. By using these intensities, the height and adsorption site of surface adatoms can be analyzed. In this review, surface electron channeling and its application to surface structure analysis are discussed.

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