An evaluation of methods of diffraction-line broadening analysis applied to ball-milled molybdenum

2004 ◽  
Vol 37 (2) ◽  
pp. 300-311 ◽  
Author(s):  
I. Lucks ◽  
P. Lamparter ◽  
E. J. Mittemeijer

A comparison has been carried out of different methods of X-ray diffraction-line profile analysis for the determination of crystallite sizes and microstrains, namely the integral breadth method and three methods based on Fourier analysis of diffraction lines, namely the Warren–Averbach method, an `alternative method' and a profile synthesis strain field method. The analyses have been applied to Mo powder ball milled in two types of mills: an attritor and a planetary mill. Using the Williamson–Hall integral breadth method, the line broadening at moderate deformation is attributed solely to microstrain,i.e.practically no size broadening is detected. The three methods based on the Fourier coefficients of diffraction lines yield comparable values for crystallite sizes and microstrains. With the profile synthesis strain field method, if a size effect is included, it is possible to fit the experimental Fourier coefficients over the entire range of the relevant scale of correlation distances. The line profile shape due to microstrains, as derived with the strain field method, exhibits a systematic dependence on the integral breadth. With increasing breadth, the shape changes from a Cauchy type to a Gaussian type, suggesting a change of the dislocation arrangement with increasing plastic deformation of molybdenum powders.

2019 ◽  
Vol 34 (2) ◽  
pp. 110-118 ◽  
Author(s):  
F. F. Contreras-Torres

The growing interest in the use of powder X-ray diffractometry for materials’ characterization has led to the introduction of relevant concepts (e.g. microstructure, strain, anisotropy, texture) to undergraduate teaching in engineering and science. In this concern, the study of polycrystalline materials underlays the use of appropriate software: free, licensed, proprietary, or commercial to assist research on structure determination, structure refinement, and microstructure characterization. Today with the easy access to personal computers, routines for powder diffractometry also becomes feasible to use for non-specialist. Therefore, it would be relevant that students with computing knowledge may decide to improve routines on such three tasks incorporating their own computational approaches. In this study, we show the development of a ready-to-use and open source program written in GNU-Octave (v4.2.1) focused on X-ray diffraction line-profile analysis. The programing language platform was chosen mainly because of two reasons: (1) there is no requirement for commercial licenses, meaning that both programing language and routines can be downloaded online, facilitating collaborative efforts between students, instructors, and developers, and (2) easy re-coding of evaluation strategies is always allowed through fast implementation of modules into the code. The code, IndexCub, features routines for background subtraction, whole profile smoothing, and Kα2 radiation removal, location of diffraction peaks positions, indexing for cubic specimens, multi peak separation of individual peaks, and evaluation of full-width at half-maximum and integral breadth values. Microstructure properties are characterized through the use of integral breadth methods (e.g. Williamson–Hall) and Fourier analysis (e.g. Warren–Averbach), and the anisotropy effects are incorporated introducing calculations of contrast factors. In terms of diffraction domain sizes, size distribution, and the lattice microstrain, the analysis of the microstructure is discussed along with examples for polycrystalline coarse-grained materials (NaCl), epitaxial film (Si), and thin-films (Au) specimens. The code facilitates the understanding of microstructure analysis by using theoretical approaches well established and in state-steady level.


2004 ◽  
Vol 443-444 ◽  
pp. 71-76 ◽  
Author(s):  
Nathalie Audebrand ◽  
Daniel Louër

The theoretical background currently used in line profile analysis is reviewed. It covers the size and structure imperfection effects at the origin of diffraction line broadening. The propagation of errors, i.e. old errors and new errors related to profile fitting techniques, is commented. The experimental conditions for minimising errors are described. Representative examples of microstructure characterisation of nanopowders are presented.


1994 ◽  
Vol 38 ◽  
pp. 397-404 ◽  
Author(s):  
Davor Baizar ◽  
Hassel Ledbetter

In the “double-Voigt” approach, an exact Voigt function describes both size- and strainbroadened profiles. The lattice strain is defined in terms of physically credible mean-square strain averageid over a distance in the diffracting domains. Analysis of Fourier coefficients in a harmonic approximation for strain coefficients leads to the Warren-Averbach method for the separation of size and strain contributions to diffraction line broadening. The model is introduced in the Rietveld refinement program in the foliowing way: Line widths are modeled with only four parameters in the isotropic case. Varied parameters are both surface- and volumeweighted domain sizes and root-mean-square strains averaged over two distances. Refined parameters determine the physically broadened Voigt line profile. Instrumental Voigt line profile parameters are added to obtain the observed (Voigt) line profile. To speed computation, the corresponding pseudo-Voigt function is calculated and used as a fitting function in refinement. This approach allows for both fast computer code and accurate modeling in terms of physically identifiable parameters.


2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap

2001 ◽  
Vol 378-381 ◽  
pp. 753-758
Author(s):  
Alexandre Boulle ◽  
C. Legrand ◽  
P. Thomas ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
...  

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