Accurate Modeling of Size and Strain Broadening in the Rietveld Refinement: The “Double-Voigt” Approach

1994 ◽  
Vol 38 ◽  
pp. 397-404 ◽  
Author(s):  
Davor Baizar ◽  
Hassel Ledbetter

In the “double-Voigt” approach, an exact Voigt function describes both size- and strainbroadened profiles. The lattice strain is defined in terms of physically credible mean-square strain averageid over a distance in the diffracting domains. Analysis of Fourier coefficients in a harmonic approximation for strain coefficients leads to the Warren-Averbach method for the separation of size and strain contributions to diffraction line broadening. The model is introduced in the Rietveld refinement program in the foliowing way: Line widths are modeled with only four parameters in the isotropic case. Varied parameters are both surface- and volumeweighted domain sizes and root-mean-square strains averaged over two distances. Refined parameters determine the physically broadened Voigt line profile. Instrumental Voigt line profile parameters are added to obtain the observed (Voigt) line profile. To speed computation, the corresponding pseudo-Voigt function is calculated and used as a fitting function in refinement. This approach allows for both fast computer code and accurate modeling in terms of physically identifiable parameters.

2004 ◽  
Vol 37 (2) ◽  
pp. 300-311 ◽  
Author(s):  
I. Lucks ◽  
P. Lamparter ◽  
E. J. Mittemeijer

A comparison has been carried out of different methods of X-ray diffraction-line profile analysis for the determination of crystallite sizes and microstrains, namely the integral breadth method and three methods based on Fourier analysis of diffraction lines, namely the Warren–Averbach method, an `alternative method' and a profile synthesis strain field method. The analyses have been applied to Mo powder ball milled in two types of mills: an attritor and a planetary mill. Using the Williamson–Hall integral breadth method, the line broadening at moderate deformation is attributed solely to microstrain,i.e.practically no size broadening is detected. The three methods based on the Fourier coefficients of diffraction lines yield comparable values for crystallite sizes and microstrains. With the profile synthesis strain field method, if a size effect is included, it is possible to fit the experimental Fourier coefficients over the entire range of the relevant scale of correlation distances. The line profile shape due to microstrains, as derived with the strain field method, exhibits a systematic dependence on the integral breadth. With increasing breadth, the shape changes from a Cauchy type to a Gaussian type, suggesting a change of the dislocation arrangement with increasing plastic deformation of molybdenum powders.


2008 ◽  
Vol 23 (1) ◽  
pp. 41-51 ◽  
Author(s):  
V. Soleimanian ◽  
S. R. Aghdaee

A comparison of different methods of X-ray diffraction analysis for the determination of crystallite size and microstrain; namely, line profile analysis, Rietveld refinement, and three approaches based on the variance method, is presented. The analyses have been applied to data collected on a ceria sample prepared by the IUCr Commission on Powder Diffraction. In the variance method, split Pearson VII, the Voigt function, and its approximation pseudo-Voigt function were fitted to X-ray diffraction line profiles. Based on the fitting results, the variances of line profiles were calculated and then the crystallite size and root mean square strain were obtained from variance coefficients. A SS plot of Langford as well as a Fourier analysis and Rietveld refinement have been carried out. The average crystallite size and microstrain were determined. The values of area-weighted domain size determined from the variance method are in agreement with those obtained from line profile analysis within a single (largest) standard uncertainty, and the volume-weighted domain sizes derived from the SS plot, Fourier size distribution, and Rietveld refinement agree within a single standard uncertainty. The results of rms strain calculated from variance and Pearson VII shape function and those from Rietveld refinements fall within a single esd. However, the variance method in conjunction with pseudo-Voigt and Voigt functions produce rms strains substantially larger than those determined from line profile analysis and Rietveld refinements.


2004 ◽  
Vol 37 (6) ◽  
pp. 911-924 ◽  
Author(s):  
D. Balzar ◽  
N. Audebrand ◽  
M. R. Daymond ◽  
A. Fitch ◽  
A. Hewat ◽  
...  

The results of both a line-broadening study on a ceria sample and a size–strain round robin on diffraction line-broadening methods, which was sponsored by the Commission on Powder Diffraction of the International Union of Crystallography, are presented. The sample was prepared by heating hydrated ceria at 923 K for 45 h. Another ceria sample was prepared to correct for the effects of instrumental broadening by annealing commercially obtained ceria at 1573 K for 3 h and slowly cooling it in the furnace. The diffraction measurements were carried out with two laboratory and two synchrotron X-ray sources, two constant-wavelength neutron and a time-of-flight (TOF) neutron source. Diffraction measurements were analyzed by three methods: the model assuming a lognormal size distribution of spherical crystallites, Warren–Averbach analysis and Rietveld refinement. The last two methods detected a relatively small strain in the sample, as opposed to the first method. Assuming a strain-free sample, the results from all three methods agree well. The average real crystallite size, on the assumption of a spherical crystallite shape, is 191 (5) Å. The scatter of results given by different instruments is relatively small, although significantly larger than the estimated standard uncertainties. The Rietveld refinement results for this ceria sample indicate that the diffraction peaks can be successfully approximated with a pseudo-Voigt function. In a common approximation used in Rietveld refinement programs, this implies that the size-broadened profile cannot be approximated by a Lorentzian but by a full Voigt or pseudo-Voigt function. In the second part of this paper, the results of the round robin on the size–strain line-broadening analysis methods are presented, which was conducted through the participation of 18 groups from 12 countries. Participants have reported results obtained by analyzing data that were collected on the two ceria samples at seven instruments. The analysis of results received in terms of coherently diffracting, both volume-weighted and area-weighted apparent domain size are reported. Although there is a reasonable agreement, the reported results on the volume-weighted domain size show significantly higher scatter than those on the area-weighted domain size. This is most likely due to a significant number of results reporting a high value of strain. Most of those results were obtained by Rietveld refinement in which the Gaussian size parameter was not refined, thus erroneously assigning size-related broadening to other effects. A comparison of results with the average of the three-way comparative analysis from the first part shows a good agreement.


1997 ◽  
Vol 30 (4) ◽  
pp. 427-430 ◽  
Author(s):  
F. Sánchez-Bajo ◽  
F. L. Cumbrera

A modified application of the variance method, using the pseudo-Voigt function as a good approximation to the X-ray diffraction profiles, is proposed in order to obtain microstructural quantities such as the mean crystallite size and root-mean-square (r.m.s.) strain. Whereas the variance method in its original form is applicable only to well separated reflections, this technique can be employed in the cases where there is line-profile overlap. Determination of the mean crystallite size and r.m.s. strain for several crystallographic directions in a nanocrystalline cubic sample of 9-YSZ (yttria-stabilized zirconia) has been performed by means of this procedure.


2004 ◽  
Vol 443-444 ◽  
pp. 71-76 ◽  
Author(s):  
Nathalie Audebrand ◽  
Daniel Louër

The theoretical background currently used in line profile analysis is reviewed. It covers the size and structure imperfection effects at the origin of diffraction line broadening. The propagation of errors, i.e. old errors and new errors related to profile fitting techniques, is commented. The experimental conditions for minimising errors are described. Representative examples of microstructure characterisation of nanopowders are presented.


2004 ◽  
Vol 37 (2) ◽  
pp. 270-278 ◽  
Author(s):  
H. Bougrab ◽  
K. Inal ◽  
H. Sabar ◽  
M. Berveiller

This work concerns dislocation microstructure analysis in order to assess stored elastic energy using Fourier coefficients of diffraction lines. These coefficients are related to the lattice distortion heterogeneity evaluated using a micromechanical approach. The lattice distortion formulation is based on dislocation density and Green's function tensors. The first tensor, which is a state quantity, characterizes the distortion incompatibility, while the second one characterizes the interaction phenomena between spatial positions. The proposed approach considers a given dislocation configuration in order to calculate the exact associated fields in a deterministic way. Periodic dislocation distributions were examined and the lattice distortion was calculated as a function of the distanceHbetween two successive dislocations (dislocation density). A short-range interaction effect was found for two values:H= 50 and 100 Å. Then Fourier coefficients of {h00}, {hhh} and {hkl} diffraction lines were estimated. It was observed that the sensitivity of the Fourier coefficients toHdepends strongly on the choice of the diffraction vector. Since the dislocation configurations were crystallographically defined, the contrast factor is included directly in our approach. For the considered slip system, it is shown that the screw periodical distribution has a higher Fourier coefficient variation than the periodical edge dislocations.


2010 ◽  
Vol 6 (S273) ◽  
pp. 200-203
Author(s):  
Matteo Cantiello ◽  
Jonathan Braithwaite ◽  
Axel Brandenburg ◽  
Fabio Del Sordo ◽  
Petri Käpylä ◽  
...  

AbstractHot luminous stars show a variety of phenomena in their photospheres and in their winds which still lack clear physical explanations at this time. Among these phenomena are non-thermal line broadening, line profile variability (LPVs), discrete absorption components (DACs), wind clumping and stochastically excited pulsations. Cantiello et al. (2009) argued that a convection zone close to the surface of hot, massive stars, could be responsible for some of these phenomena. This convective zone is caused by a peak in the opacity due to iron recombination and for this reason is referred to as the “iron convection zone” (FeCZ). 3D MHD simulations are used to explore the possible effects of such subsurface convection on the surface properties of hot, massive stars. We argue that turbulence and localized magnetic spots at the surface are the likely consequence of subsurface convection in early type stars.


2014 ◽  
Vol 8 ◽  
pp. 21-25 ◽  
Author(s):  
Sompop Poomjan ◽  
Thammarat Taengtang ◽  
Keerayoot Srinuanjan ◽  
Surachart Kamoldilok ◽  
Chesta Ruttanapun ◽  
...  

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