High-speed X-ray diffraction and in situ resistivity measurements at temperatures of 100 to 1000 K

1989 ◽  
Vol 22 (6) ◽  
pp. 523-527 ◽  
Author(s):  
J. Angilello ◽  
R. D. Thompson ◽  
K. N. Tu
Keyword(s):  
High Speed ◽  
Angular Resolution ◽  
Gold Film ◽  
Structure Property ◽  
X Ray Diffraction ◽  
Ray Method ◽  
X Ray ◽  
Resistivity Measurements ◽  
Beam Focusing

A system has been constructed which uses a primary-beam focusing monochromator Debye–Scherrer X-ray method to perform simultaneously in situ X-ray diffraction and resistivity measurements at temperatures of 100 to 1000 K. The Inel curved linear detector, which is capable of recording 120° of 20 angle without moving the detector, makes the Debye–Scherrer geometry possible for high-speed dynamic studies. The angular resolution of this system is sufficient to observe the separation of a mixture of tungsten and molybdenum powders. The sensitivity of the system makes it possible to record the diffraction pattern from a 100 Å gold film. The sheet resistivity of the sample can be recorded simultaneously to provide a structure-property correlation. Comparisons with other X-ray diffraction methods using thin films are discussed.

Evolution of Carbon Fiber Microstructure During Carbonization and High-Temperature Graphitization Measured In Situ Using Synchrotron Wide-Angle X-ray Diffraction

2015 ◽  
Vol 1754 ◽  
pp. 13-18 ◽  
Author(s):  
Michael Behr ◽  
James Rix ◽  
Brian Landes ◽  
Bryan Barton ◽  
Eric Hukkanen ◽  
...  
Keyword(s):  
High Temperature ◽  
Carbon Fiber ◽  
Tensile Modulus ◽  
Fiber Bundles ◽  
Wide Angle ◽  
High Modulus ◽  
Structure Property ◽  
X Ray Diffraction ◽  
X Ray

ABSTRACTThis paper will discuss the structure-property model developed that correlates the tensile modulus to the elastic properties and angular distribution of constituent graphitic layers for carbon fiber derived from a polyethylene precursor. In addition, a high-temperature fiber tensile device was built to enable heating of carbon fiber bundles at a variable rate from 25 °C to greater than ∼2300 °C, while simultaneously applying a tensile stress. This capability combined with synchrotron wide-angle x-ray diffraction (WAXD), enabled observation in situ and in real time of the microstructural transformation from different carbon fiber precursors to high-modulus carbon fiber. Experiments conducted using PAN- and PE-derived fiber precursors reveal stark differences in their carbonization and high-temperature graphitization behavior.

Research on Stress Calibration Technology on Aluminum of High-Speed Train Body Structure by Nondestructive X-Ray Method Measurement

2011 ◽  
Vol 189-193 ◽  
pp. 734-742
Author(s):  
Hua Ji ◽  
Hui Chen ◽  
Guo Qing Gou ◽  
Da Li ◽  
Yan Liu ◽  
...  
Keyword(s):  
Aluminum Alloy ◽  
High Speed ◽  
Stress Measurement ◽  
Diffraction Method ◽  
Welding Residual Stress ◽  
X Ray Diffraction ◽  
Ray Method ◽  
Electrometric Method ◽  
X Ray ◽  
6082 Aluminum Alloy

X-ray diffraction method has been employed to calibrate the stress of 6082 aluminum alloy which has been widely used among modern industrial products. Based on elastic tensile conditions, by designing rod sample of uniform intensity calibration (RSUIC), the stress measurement by X-ray diffraction method has been verificated by using elastic tensile theory calculation method and electrometric method. The results show that the stress measured by the tensile stress theoretical calculation, electrometric method and X-ray diffraction method was in good accordance with each other. And the matching relation between the surface stress measured by X-ray diffraction and the internal stress is investigated. The research will lay a foundation for the application of iXRD stress instrument for nondestructive measuring the welding residual stress of aluminum alloy.

In Situ X-Ray Diffraction Measurements of the Apparent Modulus of Human Dental Tissue in the Vicinity of the Dentine-Enamel Junction (DEJ)

2015 ◽  
Vol 798 ◽  
pp. 339-343
Author(s):  
Tan Sui ◽  
Si Qi Ying ◽  
Nikolaos Baimpas ◽  
Gabriel Landini ◽  
Alexander M. Korsunsky
Keyword(s):  
Structure Property ◽  
X Ray Diffraction ◽  
Dental Tissue ◽  
X Ray ◽  
Apparent Modulus ◽  
Biological Interface ◽  
Dental Restorations ◽  
Structure Property Relationship ◽  
And Function

The dentine-enamel junction (DEJ) is an important biological interface between the highly mineralized hard out layer (enamel) and the comparatively softer tooth core (dentine) of teeth. The remarkable performance of this interface provides the motivation for investigation into the detailed structure and function of the DEJ. In this study, synchrotron X-ray diffraction measurements of the DEJ subjected to the in situ uniaxial loading were carried out to capture the structure-property relationship between the DEJ architecture and its response to the applied force. The knowledge of the architecture and properties of the natural DEJ will hopefully help in biomimetic engineering of superior dental restorations and prostheses, and the development of novel materials to emulate the DEJ.

In-situ Investigation during Tempering of a High Speed Steel with X-ray Diffraction

2005 ◽  
Vol 22 (6) ◽  
pp. 407-417 ◽  
Author(s):  
Manfred Wießner ◽  
Siegfried Kleber ◽  
Alfred Kulmburg
Keyword(s):  
High Speed ◽  
High Speed Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

scholarly journals Anomalous lattice deformation in GaN/SiC(0001) measured by high-speed in situ synchrotron X-ray diffraction

2016 ◽  
Vol 108 (1) ◽  
pp. 012102 ◽  
Author(s):  
Takuo Sasaki ◽  
Fumitaro Ishikawa ◽  
Masamitu Takahasi
Keyword(s):  
High Speed ◽  
Lattice Deformation ◽  
X Ray Diffraction ◽  
X Ray

Reaction Rate Kinetics and Film Textures of Palladium Silicide Formed on Hydrogenated Amorphous Silicon

1993 ◽  
Vol 311 ◽  
Author(s):  
N. R. Manning ◽  
Haydn Chen ◽  
J. R. Abelson ◽  
L. H. Allen
Keyword(s):  
Reaction Rate ◽  
Isothermal Annealing ◽  
X Ray Diffraction ◽  
X Ray ◽  
Resistivity Measurements ◽  
Rate Kinetics ◽  
Palladium Silicide ◽  
Hydrogenated Amorphous ◽  
Kinetics Of

ABSTRACTThe reaction rate kinetics of the thin film solid-state reaction between 120 nm of Pd and 100 or 300 nm of a-Si:H(18at%) to form Pd2Si were studied in situ using x-ray diffraction and four-point probe resistivity measurements during isothermal annealing. These two techniques yielded activation energies and prefactors of Ea=1. 36±:0.11 eV with ko=4.29 cm2/sec for the x-ray diffraction experiments; and Ea=0.97±0.22 eV with ko=3.42x10-4 cm2/sec for the resistivity measurements. The activation energy and prefactor obtained from the c-Si substrate of the resistivity measurements yielded Ea=l.41±0.31 eV and ko=10.6 cm2/sec. Comparisons showed that the silicide formed from the a-Si:H reacted approximately 1.4 times faster than the silicide formed from the c-Si in the same sample, but three times faster than silicide formed on pure c-Si(111). The crystalline texture and grain size of the metal and silicide films were examined.

In-Situ Strain Measurement Via X-Ray Diffraction

1990 ◽  
Vol 208 ◽  
Author(s):  
R. D. Thompson ◽  
J. Angilello.
Keyword(s):  
High Speed ◽  
Resistivity Measurement ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Abrupt Changes ◽  
Position Sensitive ◽  
In Situ Strain Measurement ◽  
Expansion Coefficients

ABSTRACTA high speed x-ray diffraction system has been built around a Curved Position Sensitive Detector. This system has a hot/cold stage in a modified vacuum chamber to allow for control of the ambient gas mix while in-situ x-ray diffraction spectra are acquired. We have used this system to measure the strain in Al/Cr/SiO2 structures after abrupt changes in temperature. The good adhesion afforded by the Cr layer combined with the large difference in the thermal expansion coefficients of the Al (≃25×10−6/°K) and the quartz (≃0.5×10−6/°K) components make this an ideal sample for demonstrating the capabilities of this system. In-situ resistivity measurement provides an independent indication of the changes in the sample.

scholarly journals Microscale Observation via High-Speed X-ray Diffraction of Alloy 718 During In Situ Laser Melting

JOM ◽  
2020 ◽  
Vol 73 (1) ◽  
pp. 212-222 ◽  
Author(s):  
Seunghee A. Oh ◽  
Rachel E. Lim ◽  
Joseph W. Aroh ◽  
Andrew C. Chuang ◽  
Benjamin J. Gould ◽  
...  
Keyword(s):  
High Speed ◽  
Alloy 718 ◽  
X Ray Diffraction ◽  
Laser Melting ◽  
X Ray
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