Time-resolved two-dimensional observation of the change in X-ray diffuse scattering from an alloy single crystal using an imaging plate on a synchrotron-radiation source

1990 ◽  
Vol 23 (6) ◽  
pp. 509-514 ◽  
Author(s):  
H. Iwasaki ◽  
Y. Matsuo ◽  
K. Ohshima ◽  
S. Hashimoto
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Diffuse Scattering ◽  
Structural Changes ◽  
Time Interval ◽  
Imaging Plate ◽  
Two Dimensional ◽  
Diffuse Intensity ◽  
Time Resolved ◽  
X Ray

Through the high sensitivity of an area-detector Imaging Plate and the high brilliance of synchrotron radiation, changes in two-dimensional intensity distribution of X-ray diffuse scattering from an AgZn single-crystal having the B2-type structure were observed successively during the structural transition from the β′ phase to the ζ phase. It has been shown in a series of patterns taken at a time interval of 600 s that a diffuse intensity sheet extending parallel to the (111) relplane gradually loses its intensity without a precursive modulation while weak diffraction spots from the nuclei of the ζ phase appear superimposed on the sheet with a definite positional relation to the diffraction spots from the β′ phase. Promising aspects as well as the limits of the method applied to time-resolved measurements of structural changes are discussed.

scholarly journals Use of Imaging Plates in X-Ray Analysis

1997 ◽  
Vol 29 (1-2) ◽  
pp. 89-101 ◽  
Author(s):  
M. Ermrich ◽  
F. Hahn ◽  
E. R. Wölfel
Keyword(s):  
Single Crystal ◽  
Single Crystals ◽  
Powder Diffraction ◽  
Polycrystalline Materials ◽  
Imaging Plate ◽  
Two Dimensional ◽  
X Ray ◽  
Working Principle ◽  
Imaging Plates

Two-dimensional detectors have opened a new area for the investigation of both single crystals and polycrystalline materials. The working principle of Imaging Plates is described. Some characteristics and the advantages of an Imaging Plate are discussed using the STOE Imaging Plate Diffraction System for different kinds of X-ray analysis: (i) single crystal diffractometry, (ii) powder diffraction and (iii) stress and texture investigations.

scholarly journals High-viscosity injector-based pink-beam serial crystallography of microcrystals at a synchrotron radiation source

IUCrJ ◽  
2019 ◽  
Vol 6 (3) ◽  
pp. 412-425 ◽  
Author(s):  
Jose M. Martin-Garcia ◽  
Lan Zhu ◽  
Derek Mendez ◽  
Ming-Yue Lee ◽  
Eugene Chun ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Radiation Source ◽  
Structural Changes ◽  
High Viscosity ◽  
Synchrotron Radiation Source ◽  
Proteinase K ◽  
Moderate Increase ◽  
Time Resolved ◽  
X Ray ◽  
Serial Crystallography

Since the first successful serial crystallography (SX) experiment at a synchrotron radiation source, the popularity of this approach has continued to grow showing that third-generation synchrotrons can be viable alternatives to scarce X-ray free-electron laser sources. Synchrotron radiation flux may be increased ∼100 times by a moderate increase in the bandwidth (`pink beam' conditions) at some cost to data analysis complexity. Here, we report the first high-viscosity injector-based pink-beam SX experiments. The structures of proteinase K (PK) and A2A adenosine receptor (A2AAR) were determined to resolutions of 1.8 and 4.2 Å using 4 and 24 consecutive 100 ps X-ray pulse exposures, respectively. Strong PK data were processed using existing Laue approaches, while weaker A2AAR data required an alternative data-processing strategy. This demonstration of the feasibility presents new opportunities for time-resolved experiments with microcrystals to study structural changes in real time at pink-beam synchrotron beamlines worldwide.

Two-dimensional intensity profiles of effective satellites

2002 ◽  
Vol 35 (1) ◽  
pp. 69-74 ◽  
Author(s):  
S. L. Morelhão ◽  
L. H. Avanci ◽  
A. A. Quivy ◽  
E. Abramof
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Structural Parameters ◽  
Azimuthal Angle ◽  
Two Dimensional ◽  
Scattering Process ◽  
X Ray ◽  
X Ray Scattering ◽  
Beam Diffraction ◽  
Ray Scattering

The observation of a new X-ray scattering process with synchrotron radiation is reported. The phenomenon is analogous to three-beam diffraction in a single crystal; however, the features in the azimuthal scans are provided by superlattice-satellite reflections instead of bulk reflections. These features were named effective satellites and they are observed over the ordinary satellite reflections as a function of the azimuthal angle. Their occurrences have been monitored in completely different superlattices by mapping the incidence and azimuthal angles of the incident X-ray beam. Effects of structural parameters of the superlattices on the effective satellites as well as the information that can be extracted by measuring their positions are discussed.

scholarly journals A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry

2017 ◽  
Vol 50 (2) ◽  
pp. 570-575 ◽  
Author(s):  
Wolfgang Voegeli ◽  
Chika Kamezawa ◽  
Etsuo Arakawa ◽  
Yohko F. Yano ◽  
Tetsuroh Shirasawa ◽  
...  
Keyword(s):  
Thin Film ◽  
Diffuse Scattering ◽  
Measurement Time ◽  
X Rays ◽  
Two Dimensional ◽  
Time Resolved ◽  
Reflectivity Curve ◽  
X Ray ◽  
Gold Thin Film ◽  
Convergent Beam

An X-ray reflectometer using a laboratory X-ray source for quick measurements of the specular X-ray reflectivity curve is presented. It uses a bent–twisted crystal to monochromatize and focus the diverging X-rays (Cu Kα1) from a laboratory point source onto the sample. The reflected X-rays are recorded with a two-dimensional detector. Reflectivity curves can be measured without rotating the sample, detector or X-ray source during measurements. The instrument can separate the specularly reflected X-rays from the diffuse scattering background, so low reflectivities can be measured accurately. For a gold thin film on silicon, the reflectivity down to the order of 10−6 was obtained with a measurement time of 100 s and that down to 10−5 with a measurement time of 10 s. Reflectivity curves of a silicon wafer and a liquid ethylene glycol surface are shown as well. Time-resolved measurements of a TiO2 surface during UV irradiation are also reported.

scholarly journals X-ray reflectivity with a twist: Quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

2019 ◽  
Vol 114 (8) ◽  
pp. 081904 ◽  
Author(s):  
Howie Joress ◽  
Shane Q. Arlington ◽  
Timothy P. Weihs ◽  
Joel D. Brock ◽  
Arthur R. Woll
Keyword(s):  
Synchrotron Radiation ◽  
Time Resolved ◽  
X Ray ◽  
Monochromatic Synchrotron

Refinement of the crystal structure of sieleckiite and revision of its symmetry

2017 ◽  
Vol 81 (4) ◽  
pp. 917-922
Author(s):  
Peter Elliott
Keyword(s):  
Crystal Structure ◽  
Synchrotron Radiation ◽  
Single Crystal ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
Aluminium Phosphate ◽  
Unit Cell Parameters ◽  
X Ray ◽  
Cell Parameters ◽  
Phosphate Mineral

AbstractThe crystal structure of the copper aluminium phosphate mineral sieleckiite, Cu3Al4(PO4)2 (OH)12·2H2O, from the Mt Oxide copper mine, Queensland, Australia was solved from single-crystal X-ray diffraction data utilizing synchrotron radiation. Sieleckiite has monoclinic rather than triclinic symmetry as previously reported and is space group C2/m with unit-cell parameters a = 11.711(2), b = 6.9233(14), c = 9.828(2) Å, β = 92.88(3)°, V = 795.8(3) Å3and Z = 2. The crystal structure, which has been refined to R1 = 0.0456 on the basis of 1186 unique reflections with Fo > 4σF, is a framework of corner-, edge- and face- sharing Cu and Al octahedra and PO4 tetrahedra.

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