IR and X-ray time-resolved simultaneous experiments: an opportunity to investigate the dynamics of complex systems and non-equilibrium phenomena using third-generation synchrotron radiation sources

2012 ◽  
Vol 19 (6) ◽  
pp. 892-904 ◽  
Author(s):  
Augusto Marcelli ◽  
Plinio Innocenzi ◽  
Luca Malfatti ◽  
Mark A. Newton ◽  
Julietta V. Rau ◽  
...  
1997 ◽  
Vol 30 (5) ◽  
pp. 816-821 ◽  
Author(s):  
W. Bras ◽  
A. J. Ryan

The high X-ray intensity of synchrotron radiation (SR) beamlines makes it possible to perform time-resolved small-angle X-ray scattering (SAXS) experiments. The information that can be obtained by collecting the wide-angle diffraction pattern simultaneously not only increases the information content of an experiment but also increases the reliability of the time-correlations between SAXS and WAXS (wide-angle X-ray scattering) patterns. This is a great advantage for experiments with a time resolution below the level of 1 s per frame. With appropriate instrumentation, this is a time domain that is routinely accessible for a large group of research fields. This has had a considerable impact upon the understanding of fundamental aspects of phase transformations. Not only fundamental processes but also more applied fields have benefited from these developments. In polymer research this has led to a situation in which it has become possible to simulate materials processing techniques on-line. With the advent of third-generation synchrotron-radiation sources (e.g. ESRF, APS, Spring8), it has become possible to develop SAXS/WAXS beamlines that will open up new research opportunities by utilizing the higher intensity, the tuneability and the higher collimation offered by these SR sources. However, some of the instrumentation limits in detector and sample environments that have become apparent in research on second-generation synchrotron-radiation sources still have not been appropriately addressed, which means that in some fields it will not be possible to take full advantage of the superior X-ray beam quality that third-generation synchrotrons can offer. A way in which these instrumentation limits can be overcome is discussed, and the instrumentation for a new bending-magnet beamline at the ESRF is used as an example.


1991 ◽  
Vol 35 (A) ◽  
pp. 329-332
Author(s):  
Michael Hart

AbstractPolycrystalline and powder diffraction is the most commonly practised method of x-ray analysis. During the last decade the construction of dedicated synchrotron radiation sources has resulted in the renaissance of these x-ray analysis methods; ab initio structure analysis and refinement, quantitative analysis of the structure, composition and stress in thin films and on surfaces, have all been improved. New techniques providing extremely high resolution, using anomalous dispersion, diffraction and scattering at grazing incidence to control x-ray penetration depth, have been developed. This brief review of work with W. Parrish at Stanford Synchrotron Radiation Laboratory and R. J. Cernik at the Daresbury Synchrotron Radiation Source is extended to indicate how third generation sources might be exploited in materials science.


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