Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline
2016 ◽
Vol 23
(5)
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pp. 1151-1157
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Keyword(s):
X Ray
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Owing to its extreme sensitivity, quantitative mapping of elemental distributionsviaX-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.
X-ray diffraction microscopy: Reconstruction with partial magnitude and spatial a priori information
2008 ◽
Vol 26
(6)
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pp. 2362-2366
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2013 ◽
Vol 96
(6)
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pp. 1951-1957
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1988 ◽
Vol 27
(Part 1, No. 7)
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pp. 1331-1334
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