Characterization of a sCMOS-based high-resolution imaging system

2017 ◽  
Vol 24 (6) ◽  
pp. 1226-1236 ◽  
Author(s):  
Alberto Mittone ◽  
Ilja Manakov ◽  
Ludovic Broche ◽  
Christophe Jarnias ◽  
Paola Coan ◽  
...  
Keyword(s):  
High Resolution ◽  
Visible Light ◽  
Imaging System ◽  
Detection System ◽  
European Synchrotron Radiation Facility ◽  
Modulation Transfer ◽  
High Resolution Computed Tomography ◽  
X Ray ◽  
Optical Magnification ◽  
Measured Characteristic

The detection system is a key part of any imaging station. Here the performance of the novel sCMOS-based detection system installed at the ID17 biomedical beamline of the European Synchrotron Radiation Facility and dedicated to high-resolution computed-tomography imaging is analysed. The system consists of an X-ray–visible-light converter, a visible-light optics and a PCO.Edge5.5 sCMOS detector. Measurements of the optical characteristics, the linearity of the system, the detection lag, the modulation transfer function, the normalized power spectrum, the detective quantum efficiency and the photon transfer curve are presented and discussed. The study was carried out at two different X-ray energies (35 and 50 keV) using both 2× and 1× optical magnification systems. The final pixel size resulted in 3.1 and 6.2 µm, respectively. The measured characteristic parameters of the PCO.Edge5.5 are in good agreement with the manufacturer specifications. Fast imaging can be achieved using this detection system, but at the price of unavoidable losses in terms of image quality. The way in which the X-ray beam inhomogeneity limited some of the performances of the system is also discussed.

Spatio-temporal measurement of beam properties in the PLS diagnostic beamline

1998 ◽  
Vol 5 (3) ◽  
pp. 642-644 ◽  
Author(s):  
J. Y. Huang ◽  
I. S. Ko
Keyword(s):  
Visible Light ◽  
Imaging System ◽  
Ccd Camera ◽  
Photon Beam ◽  
Transverse Beam ◽  
Beam Position ◽  
X Ray ◽  
X Ray Imaging ◽  
Visible Light Imaging ◽  
Temporal Measurement

A diagnostic beamline is being constructed in the PLS storage ring for measurement of electron- and photon-beam properties. It consists of two 1:1 imaging systems: a visible-light imaging system and a soft X-ray imaging system. In the visible-light imaging system, the transverse beam size and beam position are measured with various detectors: a CCD camera, two photodiode arrays and a photon-beam position monitor. Longitudinal bunch structure is also investigated with a fast photodiode detector and a picosecond streak camera. On the other hand, the soft X-ray imaging system is under construction to measure beam sizes with negligible diffraction-limited error. The X-ray image optics consist of a flat cooled mirror and two spherical focusing mirrors.

Three Dimensional X-Ray Computed Tomography in Materials Science

MRS Bulletin ◽  
1988 ◽  
Vol 13 (1) ◽  
pp. 13-18 ◽  
Author(s):  
J.H. Kinney ◽  
Q.C. Johnson ◽  
U. Bonse ◽  
M.C. Nichols ◽  
R.A. Saroyan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Sample Preparation ◽  
Visible Light ◽  
Three Dimensional ◽  
Materials Characterization ◽  
Imaging Technology ◽  
X Ray ◽  
X Ray Imaging ◽  
Visible Light Imaging

Imaging is the cornerstone of materials characterization. Until the middle of the present century, visible light imaging provided much of the information about materials. Though visible light imaging still plays an extremely important role in characterization, relatively low spatial resolution and lack of chemical sensitivity and specificity limit its usefulness.The discovery of x-rays and electrons led to a major advance in imaging technology. X-ray diffraction and electron microscopy allowed us to characterize the atomic structure of materials. Many materials vital to our high technology economy and defense owe their existence to the understanding of materials structure brought about with these high-resolution methods.Electron microscopy is an essential tool for materials characterization. Unfortunately, electron imaging is always destructive due to the sample preparation that must be done prior to imaging. Furthermore, electron microscopy only provides information about the surface of a sample. Three dimensional information, of great interest in characterizing many new materials, can be obtained only by time consuming sectioning of an object.The development of intense synchrotron light sources in addition to the improvements in solid state imaging technology is revolutionizing materials characterization. High resolution x-ray imaging is a potentially valuable tool for materials characterization. The large depth of x-ray penetration, as well as the sensitivity of absorption crosssections to atomic chemistry, allows x-ray imaging to characterize the chemistry of internal structures in macroscopic objects with little sample preparation. X-ray imaging complements other imaging modalities, such as electron microscopy, in that it can be performed nondestructively on metals and insulators alike.

The crystal structure of visible light absorbing piezoelectric semiconductor SrNb2V2O11 revisited: high-resolution X-ray diffraction, vibrational spectroscopy and computational study

2019 ◽  
Vol 7 (18) ◽  
pp. 5497-5505
Author(s):  
Ievgen V. Odynets ◽  
Sergiy Khainakov ◽  
Santiago Garcia-Granda ◽  
Roman Gumeniuk ◽  
Matthias Zschornak ◽  
...  
Keyword(s):  
Crystal Structure ◽  
High Resolution ◽  
Visible Light ◽  
Crystal Lattice ◽  
Vibrational Spectroscopy ◽  
Computational Study ◽  
X Ray Diffraction ◽  
Piezoelectric Semiconductor ◽  
X Ray

The crystal lattice of piezoelectric semiconductor Sr2Nb2V2O11 adopts Cc ordering due to Γ2− mode distortion.

Developments of X-Ray Grating Imaging Technology

2014 ◽  
Vol 898 ◽  
pp. 614-617
Author(s):  
Rui Hong Li ◽  
Yue Ping Han
Keyword(s):  
High Resolution ◽  
Imaging System ◽  
Imaging Techniques ◽  
Field Of View ◽  
Imaging Systems ◽  
Large Field ◽  
X Ray ◽  
X Ray Imaging ◽  
Angle Scattering ◽  
Interferometry Method

The present paper reviews the X-ray grating imaging systems at home and abroad from the aspects of technological characterizations and the newest researching focus. First, not only the imaging principles and the frameworks of the typical X-ray grating imaging system based on Talbot-Lau interferometry method, but also the algorithms of retrieving the signals of attenuation, refraction and small-angle scattering are introduced. Second, the system optimizing methods are discussed, which involves mainly the relaxing the requirement of high positioning resolution and strict circumstances for gratings and designing large field of view with high resolution. Third, two and four-dimensional grating-based X-ray imaging techniques are introduced.

High-resolution X-ray topographic images of dislocations in a silicon crystal recorded using an X-ray zooming tube

1998 ◽  
Vol 5 (3) ◽  
pp. 1079-1081
Author(s):  
Shigeru Kimura ◽  
Tatsuya Matsumura ◽  
Katsuyuki Kinoshita ◽  
Keiichi Hirano ◽  
Hiroshi Kihara
Keyword(s):  
High Resolution ◽  
Digital Imaging ◽  
Imaging System ◽  
Silicon Crystal ◽  
Stage Structure ◽  
Magnification Factor ◽  
Double Crystal ◽  
X Ray ◽  
Imaging Detector ◽  
High Resolution Images

A Be-window-type X-ray zooming tube is an X-ray digital imaging system whose magnification factor of X-ray images can be easily varied from 10 to 200, and whose spatial resolution is less than 0.5 µm. This zooming tube was used as an imaging detector in double-crystal X-ray topography to obtain high-resolution images of dislocations in a silicon crystal. X-ray interference images of about 5 µm were observed even though optimal performance of the X-ray zooming tube could not be achieved. The results indicate that the X-ray zooming tube might make a good detector for X-ray topography with minor improvements in its stage structure.

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