scholarly journals xcalib: a focal spot calibrator for intense X-ray free-electron laser pulses based on the charge state distributions of light atoms

2019 ◽  
Vol 26 (4) ◽  
pp. 1017-1030 ◽  
Author(s):  
Koudai Toyota ◽  
Zoltan Jurek ◽  
Sang-Kil Son ◽  
Hironobu Fukuzawa ◽  
Kiyoshi Ueda ◽  
...  

The xcalib toolkit has been developed to calibrate the beam profile of an X-ray free-electron laser (XFEL) at the focal spot based on the experimental charge state distributions (CSDs) of light atoms. Characterization of the fluence distribution at the focal spot is essential to perform the volume integrations of physical quantities for a quantitative comparison between theoretical and experimental results, especially for fluence-dependent quantities. The use of the CSDs of light atoms is advantageous because CSDs directly reflect experimental conditions at the focal spot, and the properties of light atoms have been well established in both theory and experiment. Theoretical CSDs are obtained using xatom, a toolkit to calculate atomic electronic structure and to simulate ionization dynamics of atoms exposed to intense XFEL pulses, which involves highly excited multiple core-hole states. Employing a simple function with a few parameters, the spatial profile of an XFEL beam is determined by minimizing the difference between theoretical and experimental results. The optimization procedure employing the reinforcement learning technique can automatize and organize calibration procedures which, before, had been performed manually. xcalib has high flexibility, simultaneously combining different optimization methods, sets of charge states, and a wide range of parameter space. Hence, in combination with xatom, xcalib serves as a comprehensive tool to calibrate the fluence profile of a tightly focused XFEL beam in the interaction region.

2013 ◽  
Vol 52 (3) ◽  
pp. 509 ◽  
Author(s):  
Tatiana A. Pikuz ◽  
Anatoly Ya. Faenov ◽  
Yuji Fukuda ◽  
Masaki Kando ◽  
Paul Bolton ◽  
...  

2020 ◽  
Vol 10 (8) ◽  
pp. 2728 ◽  
Author(s):  
Svitozar Serkez ◽  
Winfried Decking ◽  
Lars Froehlich ◽  
Natalia Gerasimova ◽  
Jan Grünert ◽  
...  

X-ray pump/X-ray probe applications are made possible at X-ray Free Electron Laser (XFEL) facilities by generating two X-ray pulses with different wavelengths and controllable temporal delay. In order to enable this capability at the European XFEL, an upgrade project to equip the soft X-ray SASE3 beamline with a magnetic chicane is underway. In the present paper we describe the status of the project, its scientific focus and expected performance, including start-to-end simulations of the photon beam transport up to the sample, as well as recent experimental results demonstrating two-color lasing at photon energies of 805 eV + 835 eV and 910 eV + 950 eV. Additionally, we discuss methods to analyze the spectral properties and the intensity of the generated radiation to provide on-line diagnostics for future user experiments.


2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Bob Nagler ◽  
Andrew Aquila ◽  
Sébastien Boutet ◽  
Eric C. Galtier ◽  
Akel Hashim ◽  
...  

2020 ◽  
Vol 27 (2) ◽  
pp. 254-261 ◽  
Author(s):  
Yanwei Liu ◽  
Matthew Seaberg ◽  
Yiping Feng ◽  
Kenan Li ◽  
Yuantao Ding ◽  
...  

Wavefront sensing at X-ray free-electron lasers is important for quantitatively understanding the fundamental properties of the laser, for aligning X-ray instruments and for conducting scientific experimental analysis. A fractional Talbot wavefront sensor has been developed. This wavefront sensor enables measurements over a wide range of energies, as is common on X-ray instruments, with simplified mechanical requirements and is compatible with the high average power pulses expected in upcoming X-ray free-electron laser upgrades. Single-shot measurements were performed at 500 eV, 1000 eV and 1500 eV at the Linac Coherent Light Source. These measurements were applied to study both mirror alignment and the effects of undulator tapering schemes on source properties. The beamline focal plane position was tracked to an uncertainty of 0.12 mm, and the source location for various undulator tapering schemes to an uncertainty of 1 m, demonstrating excellent sensitivity. These findings pave the way to use the fractional Talbot wavefront sensor as a routine, robust and sensitive tool at X-ray free-electron lasers as well as other high-brightness X-ray sources.


2017 ◽  
Vol 7 (6) ◽  
pp. 584 ◽  
Author(s):  
Yuichi Inubushi ◽  
Ichiro Inoue ◽  
Jangwoo Kim ◽  
Akihiko Nishihara ◽  
Satoshi Matsuyama ◽  
...  

2011 ◽  
Vol 131 (2) ◽  
pp. 68-71
Author(s):  
Etsuo FUJIWARA ◽  
Eiichi ANAYAMA ◽  
Yuichiro KATSUTA ◽  
Toshiki IZUTANI ◽  
Daichi OKUHARA ◽  
...  

2014 ◽  
Vol 134 (12) ◽  
pp. 836-839
Author(s):  
Junichi INOUE ◽  
Yuji TANAKA ◽  
Yuki MATSUMOTO ◽  
Kensuke KANDA

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