Diamond channel-cut crystals for high-heat-load beam-multiplexing narrow-band X-ray monochromators

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Yuri Shvyd'ko ◽  
Sergey Terentyev ◽  
Vladimir Blank ◽  
Tomasz Kolodziej
Keyword(s):  
Heat Load ◽  
Narrow Band ◽  
Bragg Reflection ◽  
High Heat ◽  
High Repetition Rate ◽  
X Rays ◽  
Ray Optics ◽  
X Ray ◽  
Load Beam ◽  
High Heat Load

Next-generation high-brilliance X-ray photon sources call for new X-ray optics. Here we demonstrate the possibility of using monolithic diamond channel-cut crystals as high-heat-load beam-multiplexing narrow-band mechanically stable X-ray monochromators with high-power X-ray beams at cutting-edge high-repetition-rate X-ray free-electron laser (XFEL) facilities. The diamond channel-cut crystals fabricated and characterized in these studies are designed as two-bounce Bragg reflection monochromators directing 14.4 or 12.4 keV X-rays within a 15 meV bandwidth to 57Fe or 45Sc nuclear resonant scattering experiments, respectively. The crystal design allows out-of-band X-rays transmitted with minimal losses to alternative simultaneous experiments. Only ≲2% of the incident ∼100 W X-ray beam is absorbed in the 50 µm-thick first diamond crystal reflector, ensuring that the monochromator crystal is highly stable. Other X-ray optics applications of diamond channel-cut crystals are anticipated.

High heat load X-ray optics

1989 ◽  
Vol 2 (6) ◽  
pp. 12-12
Author(s):  
Elizabeth Stefanski
Keyword(s):  
Heat Load ◽  
High Heat ◽  
Ray Optics ◽  
X Ray ◽  
High Heat Load

scholarly journals Large-surface-area diamond (111) crystal plates for applications in high-heat-load wavefront-preserving X-ray crystal optics

2016 ◽  
Vol 23 (5) ◽  
pp. 1118-1123 ◽  
Author(s):  
Stanislav Stoupin ◽  
Sergey Antipov ◽  
James E. Butler ◽  
Alexander V. Kolyadin ◽  
Andrey Katrusha
Keyword(s):  
Surface Area ◽  
Heat Load ◽  
Crystal Surface ◽  
High Heat ◽  
Peak Position ◽  
Large Surface Area ◽  
Crystal Optics ◽  
Rocking Curve ◽  
X Ray ◽  
High Heat Load

Fabrication and results of high-resolution X-ray topography characterization of diamond single-crystal plates with large surface area (10 mm × 10 mm) and (111) crystal surface orientation for applications in high-heat-load X-ray crystal optics are reported. The plates were fabricated by laser-cutting of the (111) facets of diamond crystals grown using high-pressure high-temperature methods. The intrinsic crystal quality of a selected 3 mm × 7 mm crystal region of one of the studied samples was found to be suitable for applications in wavefront-preserving high-heat-load crystal optics. Wavefront characterization was performed using sequential X-ray diffraction topography in the pseudo plane wave configuration and data analysis using rocking-curve topography. The variations of the rocking-curve width and peak position measured with a spatial resolution of 13 µm × 13 µm over the selected region were found to be less than 1 µrad.

scholarly journals Crystal wafer as a wavelength monitor

2014 ◽  
Vol 70 (a1) ◽  
pp. C1760-C1760 ◽  
Author(s):  
Jonathan Wright
Keyword(s):  
High Heat ◽  
High Energy ◽  
X Rays ◽  
Unit Cell Parameters ◽  
Transmitted Beam ◽  
X Ray ◽  
Cell Parameters ◽  
High Heat Load ◽  
The Rich ◽  
Crystal Wafer

For accurate synchrotron data collection it is important to know the precise X-ray wavelength and to be able to monitor this value. Due to the high heat load on the X-ray optics from modern sources significant drifts may occur. Any change in wavelength is reflected as a change in the unit cell parameters derived from the data and this is especially problematic for measurements of strain. A conceptually simple device has been developed to allow measurements and monitoring of the X-ray wavelength by measuring the transmission of a silicon single crystal wafer in transmission. As the crystal is rotated in the beam different hkl reflections are diffracted leading to a loss of intensity in the transmitted beam. By measuring the incident and transmitted intensity the angles of all of these peaks can be measured with high precision while rotating the crystal, with a setup rather similar to a conventional EXAFS experiment. A similar device has also recently been developed for polychromatic experiments [1]. For high energy X-rays the wafer can be left in the beam throughout the experiment and individual reflections can be scanned to monitor the wavelength as a function of time. The rich diffraction pattern which can be recorded in this geometry should contain a wealth of information as all single rocking curves are measured with high resolution on an absolute scale in comparison to the crystal absorption. The figure shows an example scan collected at 42 keV using a silicon wafer.

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