Grazing-incidence small-angle X-ray scattering in a twofold rough-interface medium: a new theoretical approach using theq-eigenwave formalism

2015 ◽  
Vol 71 (6) ◽  
pp. 612-627 ◽  
Author(s):  
F. N. Chukhovskii ◽  
B. S. Roshchin

Based on the rigorous Green function formalism to describe the grazing-incidence small-angle X-ray scattering (GISAXS) problem, a system of two linked integral equations is derived with respect to amplitudes of the reflected and transmitted planeq-eigenwaves (eigenstatefunctions) propagating through two homogeneous media separated from each other by a rough surface interface. To build up the coupled solutions of these basic equations beyond the perturbation theory constraint 2kσθ0< 1, a simple iteration procedure is proposed as opposed to the self-consistent wave approach [Chukhovskii (2011).Acta Cryst.A67, 200–209; Chukhovski (2012).Acta Cryst.A68, 505–512]. Using the first-order iteration, analytical expressions for the averaged specular and non-specular scattering intensity distributions have been obtained. These expressions are further analysed in terms of the GISAXS parameters {k, θ, θ0} and surface finish ones \{ \sigma, \ell, h\}, where θ and θ0are the scattering and incidence angles of the X-rays, respectively, σ is the root-mean-square roughness, \ell is the correlation length,his the fractal surface model index,k= 2π/λ, and λ is the X-ray wavelength. A direct way to determine the surface finish parameters from the experimental specular and diffuse scattering indicatrix scan data is discussed for an example of GISAXS measurements from rough surfaces of α-quartz and CdTe samples.

2021 ◽  
Vol 77 (1) ◽  
pp. 42-53
Author(s):  
Vladimir M. Kaganer ◽  
Oleg V. Konovalov ◽  
Sergio Fernández-Garrido

Small-angle X-ray scattering from GaN nanowires grown on Si(111) is measured in the grazing-incidence geometry and modelled by means of a Monte Carlo simulation that takes into account the orientational distribution of the faceted nanowires and the roughness of their side facets. It is found that the scattering intensity at large wavevectors does not follow Porod's law I(q) ∝ q −4. The intensity depends on the orientation of the side facets with respect to the incident X-ray beam. It is maximum when the scattering vector is directed along a facet normal, reminiscent of surface truncation rod scattering. At large wavevectors q, the scattering intensity is reduced by surface roughness. A root-mean-square roughness of 0.9 nm, which is the height of just 3–4 atomic steps per micrometre-long facet, already gives rise to a strong intensity reduction.


2013 ◽  
Vol 21 (1) ◽  
pp. 161-164 ◽  
Author(s):  
Takayoshi Yamamoto ◽  
Hiroshi Okuda ◽  
Kohki Takeshita ◽  
Noritaka Usami ◽  
Yoshinori Kitajima ◽  
...  

Grazing-incidence small-angle X-ray scattering (GISAXS) measurements with soft X-rays have been applied to Ge nanodots capped with a Si layer. Spatially anisotropic distribution of nanodots resulted in strongly asymmetric GISAXS patterns in theqydirection in the soft X-ray region, which have not been observed with conventional hard X-rays. However, such apparent differences were explained by performing a GISAXS intensity calculation on the Ewald sphere,i.e.taking the curvature of Ewald sphere into account.


2014 ◽  
Vol 115 (20) ◽  
pp. 204311 ◽  
Author(s):  
Nie Zhao ◽  
Chunming Yang ◽  
Qian Zhang ◽  
Xueming Lu ◽  
Yuzhu Wang ◽  
...  

1999 ◽  
Vol 86 (12) ◽  
pp. 6763-6769 ◽  
Author(s):  
Markus Rauscher ◽  
Rogerio Paniago ◽  
Hartmut Metzger ◽  
Zoltan Kovats ◽  
Jan Domke ◽  
...  

2013 ◽  
Vol 46 (5) ◽  
pp. 1508-1512 ◽  
Author(s):  
Byron Freelon ◽  
Kamlesh Suthar ◽  
Jan Ilavsky

Coupling small-angle X-ray scattering (SAXS) and ultra-small-angle X-ray scattering (USAXS) provides a powerful system of techniques for determining the structural organization of nanostructured materials that exhibit a wide range of characteristic length scales. A new facility that combines high-energy (HE) SAXS and USAXS has been developed at the Advanced Photon Source (APS). The application of X-rays across a range of energies, from 10 to 50 keV, offers opportunities to probe structural behavior at the nano- and microscale. An X-ray setup that can characterize both soft matter or hard matter and high-Zsamples in the solid or solution forms is described. Recent upgrades to the Sector 15ID beamline allow an extension of the X-ray energy range and improved beam intensity. The function and performance of the dedicated USAXS/HE-SAXS ChemMatCARS-APS facility is described.


2007 ◽  
Vol 78 (11) ◽  
pp. 113910 ◽  
Author(s):  
M. A. Singh ◽  
M. N. Groves ◽  
M. S. Müller ◽  
I. J. Stahlbrand ◽  
D.-M. Smilgies

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