The effect of cosmic rays on the soft error rate of a DRAM at ground level

IEEE Transactions on Electron Devices ◽

10.1109/16.278509 ◽

1994 ◽

Vol 41 (4) ◽

pp. 553-557 ◽

Author(s):

T.J. O'Gorman

Keyword(s):

Cosmic Rays ◽

Ground Level ◽

Soft Error Rate

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Hafnium and Uranium Contributions to Soft Error Rate at Ground Level

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2008.2005778 ◽

2008 ◽

Vol 55 (6) ◽

pp. 3141-3145 ◽

Author(s):

FrÉdÉric Wrobel ◽

Jean Gasiot ◽

FrÉdÉric Saigne

Keyword(s):

Ground Level ◽

Soft Error Rate

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Impact of Ground-Level Enhancement (GLE) Solar Events on Soft Error Rate for Avionics

IEEE Transactions on Aerospace and Electronic Systems ◽

10.1109/taes.2020.2977792 ◽

2020 ◽

Vol 56 (5) ◽

pp. 3674-3684

Author(s):

Guillaume Hubert ◽

Sebastien Aubry ◽

Juan Antonio Clemente

Keyword(s):

Ground Level ◽

Ground Level Enhancement ◽

Soft Error Rate ◽

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Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation

Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 ◽

10.1109/relphy.1994.307864 ◽

1994 ◽

Author(s):

G.R. Srinivasan ◽

P.C. Murley ◽

H.K. Tang

Keyword(s):

Cosmic Rays ◽

Predictive Modeling ◽

Alpha Radiation ◽

Soft Error Rate

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High-accuracy estimation of soft error rate using PHYSERD with circuit simulation

2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.1109/sispad.2014.6931634 ◽

2014 ◽

Author(s):

Takashi Kato ◽

Taiki Uemura ◽

Hideya Matsuyama

Keyword(s):

Circuit Simulation ◽

High Accuracy ◽

Accuracy Estimation ◽

Soft Error Rate

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CLEAR: A Cross-Layer Soft Error Rate Reduction method based on mitigating DETs in nanoscale combinational logics

Microprocessors and Microsystems ◽

10.1016/j.micpro.2021.104282 ◽

2021 ◽

pp. 104282

Author(s):

Amir M. Hajisadeghi ◽

Hamid R. Zarandi

Keyword(s):

Reduction Method ◽

Cross Layer ◽

Rate Reduction ◽

Soft Error Rate

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Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131359 ◽

2011 ◽

Author(s):

S. Martinie ◽

J.L. Autran ◽

S. Sauze ◽

D. Munteanu ◽

S. Uznanski ◽

...

Keyword(s):

Alpha Particle ◽

Soft Error Rate

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Cosmic ray induced soft error rate in VLSI circuits

IEEE Electron Device Letters ◽

10.1109/edl.1983.25694 ◽

1983 ◽

Vol 4 (6) ◽

pp. 172-174 ◽

Author(s):

G.A. Sai-Halasz

Keyword(s):

Vlsi Circuits ◽

Soft Error Rate

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Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET

2021 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps46558.2021.9405216 ◽

2021 ◽

Author(s):

B. Narasimham ◽

V. Chaudhary ◽

M. Smith ◽

L. Tsau ◽

D. Ball ◽

...

Keyword(s):

Soft Error Rate

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Neutron-induced soft error rate measurements in semiconductor memories

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2007.04.049 ◽

2007 ◽

Vol 579 (1) ◽

pp. 252-255 ◽

Author(s):

Kenan Ünlü ◽

Vijaykrishnan Narayanan ◽

Sacit M. Çetiner ◽

Vijay Degalahal ◽

Mary J. Irwin

Keyword(s):

Soft Error Rate

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A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936268 ◽

2017 ◽

Author(s):

N. N. Mahatme ◽

B. Min ◽

K. Loiko

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Body Bias ◽

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