Evolution of capture cross-section of radiation-induced interface traps in MOSFETs as studied by a rapid charge pumping technique
1992 ◽
Vol 39
(6)
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pp. 2152-2157
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Keyword(s):
2002 ◽
Vol 49
(6)
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pp. 2708-2712
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Keyword(s):
2016 ◽
Vol 8
(21)
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pp. 13181-13186
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2003 ◽
Vol 40
(7)
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pp. 447-456
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Keyword(s):