Evolution of capture cross-section of radiation-induced interface traps in MOSFETs as studied by a rapid charge pumping technique

1992 ◽  
Vol 39 (6) ◽  
pp. 2152-2157 ◽  
Author(s):  
W. Chen ◽  
A. Balasinski ◽  
T.-P. Ma
2016 ◽  
Vol 8 (21) ◽  
pp. 13181-13186 ◽  
Author(s):  
Somya Gupta ◽  
Eddy Simoen ◽  
Roger Loo ◽  
Oreste Madia ◽  
Dennis Lin ◽  
...  

Author(s):  
Yu Kodama ◽  
Tatsuya Katabuchi ◽  
Gerard Rovira ◽  
Atsushi Kimura ◽  
Shoji Nakamura ◽  
...  

1953 ◽  
Vol 31 (3) ◽  
pp. 204-206 ◽  
Author(s):  
Rosalie M. Bartholomew ◽  
R. C. Hawkings ◽  
W. F. Merritt ◽  
L. Yaffe

The thermal neutron capture cross sections of Na23 and Mn55 have been determined using the activation method. The values are 0.53 ± 0.03 and 12.7 ± 0.3 barns respectively with respect to σAul97 = 93 barns. These agree well with recent pile oscillator results. The half-life for Mn56 is found to be 2.576 ± 0.002 hr.


2017 ◽  
Vol 146 ◽  
pp. 11054
Author(s):  
M. Mastromarco ◽  
M. Barbagallo ◽  
M.J. Vermeulen ◽  
N. Colonna ◽  
S. Altstadt ◽  
...  

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