Hot-carrier-stress effects on gate-induced drain leakage current in n-channel MOSFETs
2001 ◽
Vol 48
(12)
◽
pp. 2746-2753
◽
2003 ◽
Vol 24
(7)
◽
pp. 487-489
◽
Keyword(s):
2009 ◽
Vol 24
(8)
◽
pp. 085015
◽
2009 ◽
Vol 26
(1)
◽
pp. 017304
◽