Degradation and Recovery of NMOS Subthreshold Leakage Current by Off-state Hot Carrier Stress

2006 ◽  
Author(s):  
Z. Yang ◽  
F. Guarin
Keyword(s):  
Leakage Current ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Subthreshold Leakage

Gate Overlapped Lightly Doped Drain Poly-Si TFTs Employing 45° Tilt Implant For Source and Drain

2004 ◽  
Vol 808 ◽  
Author(s):  
Jae-Hoon Lee ◽  
Moon-Young Shin ◽  
Heesun Shin ◽  
Woo-Jin Nam ◽  
Min-Koo Han
Keyword(s):  
Leakage Current ◽  
Short Channel ◽  
Hot Carrier ◽  
Ion Doping ◽  
Channel Gate ◽  
Hot Carrier Stress ◽  
Lightly Doped Drain

ABSTRACTWe propose a short channel gate overlapped lightly doped drain (GOLDD) poly-Si TFT employing 45° tilt implant for source and drain (S/D) regions without any additional ion doping or mask. Oblique-incident ELA activation is performed to activate both n+ S/D and n- LDD regions as well as cure junction defects. The proposed poly-Si TFT can suppress the anomalous leakage current, and exhibit the better reliability against the hot-carrier stress.

Study on Time Constants of Random Telegraph Noise in Gate Leakage Current Through Hot-Carrier Stress Test

2010 ◽  
Vol 31 (9) ◽  
pp. 1029-1031 ◽  
Author(s):  
Heung-Jae Cho ◽  
Younghwan Son ◽  
Byoung-Chan Oh ◽  
Sanghoon Lee ◽  
Jong-Ho Lee ◽  
...  
Keyword(s):  
Leakage Current ◽  
Stress Test ◽  
Gate Leakage Current ◽  
Gate Leakage ◽  
Random Telegraph Noise ◽  
Time Constants ◽  
Hot Carrier ◽  
Telegraph Noise ◽  
Hot Carrier Stress

DC pulse hot-carrier-stress effects on gate-induced drain leakage current in n-channel MOSFETs

2001 ◽  
Vol 48 (12) ◽  
pp. 2746-2753 ◽  
Author(s):  
Ja-Hao Chen ◽  
Shyh-Chyi Wong ◽  
Yeong-Her Wang
Keyword(s):  
Leakage Current ◽  
Hot Carrier ◽  
Stress Effects ◽  
Hot Carrier Stress

A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFETs

1999 ◽  
Vol 46 (9) ◽  
pp. 1877-1882 ◽  
Author(s):  
Tahui Wang ◽  
Lu-Ping Chiang ◽  
Nian-Kai Zous ◽  
Charng-Feng Hsu ◽  
Li-Yuan Huang ◽  
...  
Keyword(s):  
Leakage Current ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Thin Oxide ◽  
Comprehensive Study
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