scholarly journals The Effects of Comparator Dynamic Capacitor Mismatch in SAR ADC and Correction

IEEE Access ◽  
2018 ◽  
Vol 6 ◽  
pp. 7037-7043 ◽  
Author(s):  
Jian Luo ◽  
Jing Li ◽  
Ning Ning ◽  
Yang Liu ◽  
Qi Yu
2020 ◽  
Vol 29 (16) ◽  
pp. 2050264
Author(s):  
Ning Ding ◽  
Yusong Mu ◽  
Yuping Guo ◽  
Teng Chen ◽  
Yuchun Chang

This paper presents a 6.4-GS/s 16-way 10-bit time-interleaved (TI) SAR ADC for wideband wireless applications. A two-stage master–slave hierarchical sampling network, which is immune to the time skew of multi-phase clocks, is introduced to avoid the time-skew calibration for design simplicity and hardware efficiency. To perform low distortion and fast sampling at acceptable power consumption, a linearity- and energy efficiency-improved track-and-hold (T&H) buffer with current-feedback compensation scheme is proposed. Accompanied by its low-output-impedance feature, the buffer obtains adequate bandwidth which can cover the entire ADC Nyquist sampling range. Moreover, the split capacitor DAC combined with a novel nonbinary algorithm is adopted in single-channel ADC, enabling a shorter DAC settling time as well as less switching energy. Capacitor mismatch effect with related design trade-off is discussed and behavior models are built to evaluate the effect of capacitor mismatch on ENOB. An asynchronous self-triggered SAR logic is designed and optimized to minimize the delay on logic paths to match up the acceleration on DAC and comparator. With these proposed techniques, the 10-b sub-ADC achieves a 400-MHz conversion rate with only 3.5-mW power consumption. The circuit is designed and simulated in TSMC 28 HPC process and the results show that the overall ADC achieves 54.6-dB SNDR and 58.1-dB SFDR at Nyquist input while consuming 127-mW power from 1-V/1.5-V supply and achieving a Walden FoM of 45[Formula: see text]fJ/conv-step.


2010 ◽  
Vol E93-C (11) ◽  
pp. 1630-1637 ◽  
Author(s):  
Yasuhide KURAMOCHI ◽  
Masayuki KAWABATA ◽  
Kouichiro UEKUSA ◽  
Akira MATSUZAWA

2013 ◽  
Vol 11 ◽  
pp. 227-230
Author(s):  
J. Bialek ◽  
A. Wickmann ◽  
F. Ohnhaeuser ◽  
G. Fischer ◽  
R. Weigel ◽  
...  

Abstract. Successive approximation register (SAR) analog-to-digital Converters (ADC) are based on a capacitive digital-to-analog converter (CDAC) (McCreary and Gray, 1975). The capacitor mismatch in the capacitor array of the CDAC impacts the differential non-linearity (DNL) of the ADC directly. In order to achieve a transfer function without missing codes, trimming of the capacitor array becomes necessary for SAR ADCs with a resolution of more than 12 bit. This article introduces a novel digital approach for trimming. DNL measurements of an 18 bit SAR ADC show that digital trimming allows the same performance as analog trimming. Digital trimming however reduces the power consumption of the ADC, the die size and the required time for the production test.


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