An Optimal Model to Meet the Hourly Peak Demands of a Specific Region With Solar, Wind, and Grid Supplies

ABSTRACTSaturn's broad E ring, the narrow G ring and the structured and apparently time variable F ring(s), contain many micron and sub-micron sized particles, which make up the “visible” component. These rings (or ring systems) are in direct contact with magnetospheric plasma. Fluctuations in the plasma density and/or mean energy, due to magnetospheric and solar wind processes, may induce stochastic charge variations on the dust particles, which in turn lead to an orbit perturbation and spatial diffusion. It is suggested that the extent of the E ring and the braided, kinky structure of certain portions of the F rings as well as possible time variations are a result of plasma induced electromagnetic perturbations and drag forces. The G ring, in this scenario, requires some form of shepherding and should be akin to the F ring in structure. Sputtering of micron-sized dust particles in the E ring by magnetospheric ions yields lifetimes of 102to 104years. This effect as well as the plasma induced transport processes require an active source for the E ring, probably Enceladus.

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A technique to prepare cross-sectional TEM specimens of semiconducting devices

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014508x ◽

1986 ◽

Vol 44 ◽

pp. 742-743

Author(s):

A. K. Rai ◽

P. P. Pronko

Keyword(s):

Thin Films ◽

Surface Region ◽

Sample Surface ◽

Specific Region ◽

Cross Sectional ◽

Thin Sections ◽

The Past ◽

Device Structures ◽

Ion Implanted

Several techniques have been reported in the past to prepare cross(x)-sectional TEM specimen. These methods are applicable when the sample surface is uniform. Examples of samples having uniform surfaces are ion implanted samples, thin films deposited on substrates and epilayers grown on substrates. Once device structures are fabricated on the surfaces of appropriate materials these surfaces will no longer remain uniform. For samples with uniform surfaces it does not matter which part of the surface region remains in the thin sections of the x-sectional TEM specimen since it is similar everywhere. However, in order to study a specific region of a device employing x-sectional TEM, one has to make sure that the desired region is thinned. In the present work a simple way to obtain thin sections of desired device region is described.

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Quantitative surface damage studies by H.R.E.M.

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010015513x ◽

1989 ◽

Vol 47 ◽

pp. 632-633

Author(s):

S. R. Singh ◽

H. J. Fan ◽

L. D. Marks

Keyword(s):

Solar Wind ◽

Quantitative Analysis ◽

Surface Science ◽

Surface Damage ◽

Space Environment ◽

Oxygen Desorption ◽

The Past ◽

Diffusion Controlled ◽

Original Observation ◽

Substantial Interest

Since the original observation that the surfaces of materials undergo radiation damage in the electron microscope similar to that observed by more conventional surface science techniques there has been substantial interest in understanding these phenomena in more detail; for a review see. For instance, surface damage in a microscope mimics damage in the space environment due to the solar wind and electron beam lithographic operations.However, purely qualitative experiments that have been done in the past are inadequate. In addition, many experiments performed in conventional microscopes may be inaccurate. What is needed is careful quantitative analysis including comparisons of the behavior in UHV versus that in a conventional microscope. In this paper we will present results of quantitative analysis which clearly demonstrate that the phenomena of importance are diffusion controlled; more detailed presentations of the data have been published elsewhere.As an illustration of the results, Figure 1 shows a plot of the shrinkage of a single, roughly spherical particle of WO3 versus time (dose) driven by oxygen desorption from the surface.

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